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HCPL-0708060 PDF预览

HCPL-0708060

更新时间: 2024-11-24 22:34:07
品牌 Logo 应用领域
安捷伦 - AGILENT 光电输出元件
页数 文件大小 规格书
10页 267K
描述
High Speed CMOS Optocoupler

HCPL-0708060 技术参数

生命周期:Transferred包装说明:SO-8
Reach Compliance Code:unknown风险等级:5.3
Is Samacsys:N其他特性:UL RECOGNIZED, VDE APPROVED, CMOS COMPATIBLE
配置:SINGLE标称数据速率:15 MBps
最大正向电流:0.016 A最大绝缘电压:3750 V
元件数量:1最大通态电流:0.002 A
最高工作温度:100 °C最低工作温度:-40 °C
光电设备类型:LOGIC IC OUTPUT OPTOCOUPLER最小供电电压:4.5 V
Base Number Matches:1

HCPL-0708060 数据手册

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Agilent HCPL-0708  
High Speed  
CMOS Optocoupler  
Data Sheet  
Features  
• +5 V CMOS compatibility  
• 15 ns typical pulse width distortion  
• 30 ns max. pulse width distortion  
Description  
• 40 ns max. propagation delay  
skew  
0708 are a high speed LED and a  
CMOS detector IC. The detector  
incorporates an integrated  
photodiode, a high-speed trans-  
impedance amplifier, and a voltage  
comparator with an output driver.  
Available in SO-8 package, the  
HCPL-0708 optocoupler utilizes the  
latest CMOS IC technology to  
achieve outstanding performance  
with very low power consumption.  
Basic building blocks of the HCPL-  
• High speed: 15 MBd  
• 60 ns max. propagation delay  
• 10 kV/µs minimum common mode  
rejection  
• –40 to 100°C temperature range  
• Safety and regulatory approvals  
pending  
– UL recognized  
Functional Diagram  
2500 V rms for 1 min. per  
UL 1577 for HCPL-0708  
– CSA component acceptance  
Notice #5  
– VDE 0884 (TUV) approved for  
HCPL-0708 Option 060  
NC  
1
2
8
7
V
DD  
ANODE  
NC  
3
4
6
5
CATHODE  
NC  
V
O
Applications  
• Scan drive in PDP  
GND  
• Digital field bus isolation:  
DeviceNet, SDS, Profibus  
• Multiplexed data transmission  
• Computer peripheral interface  
• Microprocessor system interface  
• DC/DC converter  
TRUTH TABLE  
*A 0.1 µF bypass capacitor  
must be connected between  
pins 5 and 8.  
LED  
V
, OUTPUT  
O
OFF  
ON  
H
L
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this  
component to prevent damage and/or degradation which may be induced by ESD.  

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