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HCC4049UBK PDF预览

HCC4049UBK

更新时间: 2024-02-25 00:08:38
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 逻辑集成电路触发器
页数 文件大小 规格书
24页 303K
描述
Rad-hard high voltage CMOS logic series

HCC4049UBK 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL16,.3Reach Compliance Code:unknown
风险等级:5.84JESD-30 代码:R-XDFP-F16
JESD-609代码:e0逻辑集成电路类型:INVERTER
端子数量:16最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC
封装代码:DFP封装等效代码:FL16,.3
封装形状:RECTANGULAR封装形式:FLATPACK
电源:4.5/15 V认证状态:Not Qualified
施密特触发器:NO子类别:Gates
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:FLAT端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

HCC4049UBK 数据手册

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HCC40xxx  
HCC45xxx  
Rad-hard high voltage CMOS logic series  
Features  
3 to 20 V max operating voltage  
Bufferized inputs and outputs  
Standardized symmetrical outputs  
characteristic  
Flat-14  
DIL-14  
50 ns typical propagation delays  
100 nA max 25 °C input current  
100% tested 20 V quiescent current  
5-10-15 V parametric testing  
Hermetic packages  
Rad-hard 100 kRad TID at 11rad/sec dose rate  
SEL-SEU immune to 72 MeV/cm²/mg LET ions  
ESCC qualified  
DIL-16  
Flat-16  
Description  
The HCC40xxx and HCC45xxx series are  
composed of over 70 types of high voltage CMOS  
functions, offering a set of highly noise tolerant  
gates, Flip-Flops, multiplexers, counters, bus  
interfaces and several other functions. The  
radiation hardness, the single event latch-up  
(SEL) and the single event upset (SEU) immunity  
and the housing in hermetic packages of all types  
of both series make them usable in the most  
difficult environmental conditions.  
Flat-24  
DIL-24  
The upper metallic lid is not electrically connected to any  
pins, nor to the IC die inside the package.  
The complete specification of each type is  
available from the European Space Components  
Coordination web site (ESCC):  
https://spacecomponents.org/. ST guarantees full  
compliance of qualified parts with these ESCC  
detailed specifications.  
August 2011  
Doc ID 17102 Rev 3  
1/24  
www.st.com  
24  

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