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GT8G132_06 PDF预览

GT8G132_06

更新时间: 2024-11-18 03:29:19
品牌 Logo 应用领域
东芝 - TOSHIBA 闪光灯
页数 文件大小 规格书
6页 187K
描述
Strobe Flash Applications

GT8G132_06 数据手册

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GT8G132  
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT  
GT8G132  
Strobe Flash Applications  
Unit: mm  
Supplied in compact and thin package requires only a small  
mounting area  
5th generation (trench gate structure) IGBT  
Enhancement-mode  
4-V gate drive voltage: V  
= 4.0 V (min) (@I = 150 A)  
C
GE  
Peak collector current: I = 150 A (max)  
C
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
V
Collector-emitter voltage  
V
CES  
V
GES  
V
GES  
400  
±6  
DC  
Gate-emitter voltage  
Collector current  
V
A
Pulse  
DC  
±8  
I
8
C
1 ms  
(Note 1)  
I
150  
1.1  
CP  
JEDEC  
JEITA  
Collector power dissipation  
Junction temperature  
P
W
°C  
°C  
C
T
j
150  
55~150  
TOSHIBA  
2-6J1C  
Storage temperature range  
T
stg  
Weight: 0.080 g (typ.)  
2
Note 1: Drive operation: Mount on glass epoxy board [1 inch × 1.5 t]  
Note 2: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
Equivalent Circuit  
8
7
6
5
Please design the appropriate reliability upon reviewing the  
Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/Derating Concept and Methods) and individual  
reliability data (i.e. reliability test report and estimated failure  
rate, etc).  
1
2
3
4
These devices are MOS type. Users should follow proper ESD handling procedures.  
Operating condition of turn-off dv/dt should be lower than 400 V/μs.  
1
2006-11-02  

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