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GE28F640W30T85 PDF预览

GE28F640W30T85

更新时间: 2024-11-24 23:53:39
品牌 Logo 应用领域
其他 - ETC 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
91页 974K
描述
EEPROM|FLASH|4MX16|CMOS|BGA|56PIN|PLASTIC

GE28F640W30T85 数据手册

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1.8 Volt Intel® Wireless Flash Memory  
with 3 Volt I/O  
28F320W30, 28F640W30, 28F128W30  
Datasheet  
Product Features  
High Performance Read-While-Write/Erase  
— Burst Frequency at 40 MHz  
— 70 ns Initial Access Speed  
— 25 ns Page-Mode Read Speed  
— 20 ns Burst-Mode Read Sp eed  
— Burst and Page Mode in All Blocks and  
across All Partition Boundaries  
— Burst Suspend Feature  
Flash Architecture  
— Multiple 4-Mbit Partitions  
— Dual Operation: RWW or RWE  
— Parameter Block Size = 4-Kword  
— Main block size = 32-Kword  
— Topand Bottom Parameter Devices  
Flash Software  
— 5/9 µs (typ.) Program/Erase Suspend Latency  
Time  
— Enhanced Factory Programming:  
3.5 µs per Word Program Time  
— Programmable WAIT Signal Polarity  
Quality and Reliability  
— Intel® Flash Data Integrator (FDI) and  
Common Flash Interface (CFI) Compatible  
Flash Power  
— Operating Temperature:  
— VCC = 1.70 V – 1.90 V  
–40 °C to +85 °C  
— VCCQ = 2.20 V – 3.30 V  
— Standby Current = 6 µA (typ.)  
— Read Current = 7 mA  
— 100K Minimum Erase Cycles  
— 0.13 µm ETOX™ VII Process  
Flash Security  
(4 word burst, typ.)  
— 128-bit Protection Register: 64 Unique Device Density and Packaging  
Identifier Bits; 64 User OTP Protection  
Register Bits  
— 32-, 64-, and 128-Mbit Densities in VF BGA  
Package  
— Absolute Write Protection with VPP at Ground  
— Program and Erase Lockout during Power  
Transitions  
— 56 Active Ball Matrix, 0.75 mm Ball-Pitch in  
VF BGA Packages  
— 16-bit Data Bus  
— Individual and Instantaneous Block Locking/  
Unlocking with Lock-Down  
The 1.8 Volt Intel®Wireless Flash Memory with 3 Volt I/O combines state-of-the-art Intel® Flash technology to  
provide the most versatile memory solution for high performance, low power, board constraint memory  
applications.  
The 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O offers a multi-partition, dual-operation flash architecture  
that enables the device to read from one partition while programming or erasing in another partition. This Read-  
While-Write or Read-While-Erase capability makes it possible to achieve higher data throughput rates as compared  
to single partition devices and it allows two processors to interleave code execution because program and erase  
operations can now occur as background processes.  
The 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O incorporates a new Enhanced Factory Programming  
(EFP) mode to improve 12 V factory programming performance. This new feature helps eliminate manufacturing  
bottlenecks associated with programming high density flash devices. Compare the EFP program time of 3.5 µs per  
word to the standard factory program time of 8.0 µs per word and save significant factory programming time for  
improved factory efficiency.  
Additionally, the 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O includes block lock-down, programmable  
WAIT signal polarity and is supported by an array of software tools. All these features make this product a perfect  
solution for any demanding memory application.  
Notice: This document contains information on new products in production. The specifications  
are subject to change without notice. Verify with your local Intel sales office that you have the lat-  
est datasheet before finalizing a design.  
290702-004  
April 2002  

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