1.8 Volt Intel® Wireless Flash Memory
with 3 Volt I/O
28F320W30, 28F640W30, 28F128W30
Datasheet
Product Features
■ High Performance Read-While-Write/Erase
— Burst Frequency at 40 MHz
— 70 ns Initial Access Speed
— 25 ns Page-Mode Read Speed
— 20 ns Burst-Mode Read Sp eed
— Burst and Page Mode in All Blocks and
across All Partition Boundaries
— Burst Suspend Feature
■ Flash Architecture
— Multiple 4-Mbit Partitions
— Dual Operation: RWW or RWE
— Parameter Block Size = 4-Kword
— Main block size = 32-Kword
— Topand Bottom Parameter Devices
■ Flash Software
— 5/9 µs (typ.) Program/Erase Suspend Latency
Time
— Enhanced Factory Programming:
3.5 µs per Word Program Time
— Programmable WAIT Signal Polarity
■ Quality and Reliability
— Intel® Flash Data Integrator (FDI) and
Common Flash Interface (CFI) Compatible
■ Flash Power
— Operating Temperature:
— VCC = 1.70 V – 1.90 V
–40 °C to +85 °C
— VCCQ = 2.20 V – 3.30 V
— Standby Current = 6 µA (typ.)
— Read Current = 7 mA
— 100K Minimum Erase Cycles
— 0.13 µm ETOX™ VII Process
■ Flash Security
(4 word burst, typ.)
— 128-bit Protection Register: 64 Unique Device ■ Density and Packaging
Identifier Bits; 64 User OTP Protection
Register Bits
— 32-, 64-, and 128-Mbit Densities in VF BGA
Package
— Absolute Write Protection with VPP at Ground
— Program and Erase Lockout during Power
Transitions
— 56 Active Ball Matrix, 0.75 mm Ball-Pitch in
VF BGA Packages
— 16-bit Data Bus
— Individual and Instantaneous Block Locking/
Unlocking with Lock-Down
The 1.8 Volt Intel®Wireless Flash Memory with 3 Volt I/O combines state-of-the-art Intel® Flash technology to
provide the most versatile memory solution for high performance, low power, board constraint memory
applications.
The 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O offers a multi-partition, dual-operation flash architecture
that enables the device to read from one partition while programming or erasing in another partition. This Read-
While-Write or Read-While-Erase capability makes it possible to achieve higher data throughput rates as compared
to single partition devices and it allows two processors to interleave code execution because program and erase
operations can now occur as background processes.
The 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O incorporates a new Enhanced Factory Programming
(EFP) mode to improve 12 V factory programming performance. This new feature helps eliminate manufacturing
bottlenecks associated with programming high density flash devices. Compare the EFP program time of 3.5 µs per
word to the standard factory program time of 8.0 µs per word and save significant factory programming time for
improved factory efficiency.
Additionally, the 1.8 Volt Intel Wireless Flash Memory with 3 Volt I/O includes block lock-down, programmable
WAIT signal polarity and is supported by an array of software tools. All these features make this product a perfect
solution for any demanding memory application.
Notice: This document contains information on new products in production. The specifications
are subject to change without notice. Verify with your local Intel sales office that you have the lat-
est datasheet before finalizing a design.
290702-004
April 2002