®
1.8 Volt Intel StrataFlash Wireless
Memory with 3.0 Volt I/O (L30)
28F640L30, 28F128L30, 28F256L30
Datasheet
Product Features
■ High performance Read-While-Write/Erase
— 90 ns initial access
■ Software
— 20 µs (Typ) program suspend
— 50MHz with zero wait state, 17 ns clock-to-data
— 20 µs (Typ) erase suspend
output synchronous-burst mode
— Intel® Flash Data Integrator (FDI) optimized
— Basic Command Set (BCS) and Extended
Command Set (ECS) compatible
— 25 ns asynchronous-page mode
— 4-, 8-, 16-, and continuous-word burst mode
— Burst suspend
— Common Flash Interface (CFI) capable
— Programmable WAIT configuration
— Buffered Enhanced Factory Programming
(Buffered EFP): 3.5 µs/byte (Typ)
— 1.8 V low-power buffered and non-buffered
programming @ 10 µs/byte (Typ)
■ Security
• OTP space:
— 64 unique device identifier bits
— 64 user-programmable OTP bits
■ Architecture
— Additional 2048 user-programmable OTP
bits
— Absolute write protection: VPP = GND
— Power-transition erase/program lockout
— Individual zero-latency block locking
— Individual block lock-down
— Asymmetrically-blocked architecture
— Multiple 8-Mbit partitions
— Four 16K-Word parameter blocks: top or
bottom configurations
— 64K-Word main blocks
— Dual-operation: Read-While-Write (RWW) or
■ Quality and Reliability
Read-While-Erase (RWE)
— Expanded temperature: –25° C – +85° C
— Minimum 100,000 erase cycles per block
— ETOX™ VIII process technology (0.13 µm)
■ Density and Packaging
— Status register for partition and device status
■ Power
— 1.7 V - 2.0 V VCC operation
— I/O voltage: 2.2 V - 3.3 V
— Standby current: 30 µA (Typ)
— 4-Word synchronous read current: 17 mA (Typ)
@ 54 MHz
— 64-, 128- and 256-Mbit density in VF BGA
packages
— 16-bit wide data bus
— Automatic Power Savings (APS) mode
The 1.8 Volt Intel StrataFlash® wireless memory with 3-Volt I/O product is the latest generation of
Intel StrataFlash® memory devices featuring flexible, multiple-partition, dual operation. It provides high
performance asynchronous read mode and synchronous-burst read mode using 1.8 Volt low-voltage, multi-
level cell (MLC) technology.
The multiple-partition architecture enables background programming or erasing to occur in one partition
while code execution or data reads take place in another partition. This dual-operation architecture also
allows two processors to interleave code operations while program and erase operations take place in the
background. 8-Mbit partitions allow system designers to choose the size ofthe code and data segments.
The 1.8 Volt Intel StrataFlash® wireless memory with 3-Volt I/O device is manufactured using Intel
0.13 µm ETOX™ VIII process technology. It is available in industry-standard chip scale packaging.
.
Notice: This document contains information on products in the design phase of
development. The information here is subject to change without notice. Do not finalize
a design w ith this information.
Order Number: 251903
October 2002