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FSS234R3 PDF预览

FSS234R3

更新时间: 2024-11-23 20:16:11
品牌 Logo 应用领域
英飞凌 - INFINEON 局域网开关脉冲晶体管
页数 文件大小 规格书
9页 118K
描述
Power Field-Effect Transistor, 6A I(D), 250V, 0.6ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-257AA

FSS234R3 数据手册

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FSS234D, FSS234R  
6A, 250V, 0.600 Ohm, Rad Hard,  
SEGR Resistant, N-Channel Power MOSFETs  
December 2001  
Features  
• 6A, 250V, r  
• Total Dose  
Description  
= 0.600Ω  
The Discrete Products Operation of Fairchild Corporation has  
developed a series of Radiation Hardened MOSFETs specifi-  
cally designed for commercial and military space applications.  
DS(ON)  
- Meets Pre-RAD Specifications to 100K RAD (Si)  
Enhanced Power MOSFET immunity to Single Event Effects  
(SEE), Single Event Gate Rupture (SEGR) in particular, is  
combined with 100K RADS of total dose hardness to provide  
devices which are ideally suited to harsh space environments.  
The dose rate and neutron tolerance necessary for military  
applications have not been sacrificed.  
• Single Event  
- Safe Operating Area Curve for Single Event Effects  
2
- SEE Immunity for LET of 36MeV/mg/cm with  
V
up to 80% of Rated Breakdown and  
of 10V Off-Bias  
DS  
V
GS  
The Fairchild portfolio of SEGR resistant radiation hardened  
MOSFETs includes N-Channel and P-Channel devices in a  
variety of voltage, current and on-resistance ratings.  
Numerous packaging options are also available.  
• Dose Rate  
- Typically Survives 3E9 RAD (Si)/s at 80% BV  
DSS  
- Typically Survives 2E12 if Current Limited to I  
DM  
This MOSFET is an enhancement-mode silicon-gate power  
field-effect transistor of the vertical DMOS (VDMOS) struc-  
ture. It is specially designed and processed to be radiation  
tolerant. The MOSFET is well suited for applications exposed  
to radiation environments such as switching regulation,  
switching converters, motor drives, relay drivers and drivers  
for high-power bipolar switching transistors requiring high  
speed and low gate drive power. This type can be operated  
directly from integrated circuits.  
• Photo Current  
- 4.0nA Per-RAD(Si)/s Typically  
• Neutron  
- Maintain Pre-RAD Specifications  
for 1E13 Neutrons/cm  
2
2
- Usable to 1E14 Neutrons/cm  
Reliability screening is available as either commercial, TXV  
equivalent of MIL-S-19500, or Space equivalent of  
MIL-S-19500. Contact Fairchild for any desired deviations  
from the data sheet.  
Ordering Information  
RAD LEVEL SCREENING LEVEL PART NUMBER/BRAND  
10K  
Commercial  
TXV  
FSS234D1  
FSS234D3  
FSS234R1  
FSS234R3  
FSS234R4  
10K  
Symbol  
D
100K  
100K  
100K  
Commercial  
TXV  
Space  
G
Formerly available as type TA17638.  
S
Package  
TO-257AA  
S
D
G
CAUTION: Beryllia Warning per MIL-S-19500  
refer to package specifications.  
©2001 Fairchild Semiconductor Corporation  
FSS234D, FSS234R Rev. B  

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