Document Number S32R372
Rev. 4, 08/2018
NXP Semiconductors
Data Sheet: Technical Data
S32R372
S32R372 Data Sheet
Features
• Security
– Cryptographic Security Engine (CSE2)
– Supports censorship and life-cycle management
• Dual issue computation cores: Power Architecture®
e200z7 32-bit CPU
• Timers
• 1.3 MB on-chip code flash memory (FMC flash
memory) with ECC
– Two Periodic Interval Timers (PIT) with 32-bit
counter resolution
• 1 MB on-chip SRAM with ECC
– Two System Timer Module (STM)
– Two Software Watchdog Timers (SWT)
– One eTimer module with 6 channels each
– One FlexPWM module for 12 PWM signals
• RADAR processing
– Signal Processing Toolbox (SPT) for RADAR signal
processing acceleration
– Cross Triggering Engine (CTE) for precise timing
generation and triggering
– MIPICSI2 interface to connect external RADAR RX
ADCs
• Communication interfaces
– Two Serial Peripheral interface (SPI) modules
– One LINFlexD module
– Two inter-IC communication interface (I2C)
modules
– Two FlexCAN modules supporting CAN FD with
configurable buffers
• Memory protection
– Each core memory protection unit provides 24
entries
– Data and instruction bus system memory protection
unit (SMPU) with 16 region descriptors each
– Register protection
• Debug functionality
– 4-pin JTAG interface and Nexus/Aurora interface
for serial high-speed tracing
– e200z7 core: Nexus development interface (NDI)
per IEEE-ISTO 5001-2012 Class 3+
• Clock generation
– 40 MHz external crystal (XOSC)
– 16 MHz Internal oscillator (IRCOSC)
– Dual system PLL with one frequency modulated
phase-locked loop (FMPLL)
• Two analog-to-digital converters (SAR ADC)
– Each ADC supports up to 16 input channels
– Cross Trigger Unit (CTU)
– Low-jitter PLL
• On-chip voltage DC/DC regulator for core supply
generation (VREG)
• Functional safety
– Enables ASIL-B applications
– Fault Collection and Control Unit (FCCU) for fault
collection and fault handling
• Two Temperature Sensors (TSENS)
– Memory Error Management Unit (MEMU) for
memory error management
– Safe eDMA controller
– Self-Test Control Unit (STCU2)
– Error Injection Module (EIM)
– On-chip voltage monitoring
– Clock Monitor Unit (CMU)
NXP reserves the right to change the production detail specifications as may be
required to permit improvements in the design of its products.