March 2013
FQB22P10 / FQI22P10
P-Channel QFET MOSFET
-100 V, -22 A, 125 mΩ
Description
Features
This P-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor®’s proprietary
planar stripe and DMOS technology. This advanced
MOSFET technology has been especially tailored to reduce
on-state resistance, and to provide superior switching
performance and high avalanche energy strength. These
devices are suitable for switched mode power supplies,
audio amplifier, DC motor control, and variable switching
power applications.
•
-22 A, -100 V, RDS(on) = 125 mΩ (Max) @VGS = -10 V,
ID = -11 A
•
•
•
•
Low Gate Charge (Typ. 40 nC)
Low Crss (Typ. 160 pF)
100% Avalanche Tested
175°C Maximum Junction Temperature Rating
D
D
G
G
S
D2-PAK
FQB Series
I2-PAK
FQI Series
G D S
S
Absolute Maximum Ratings
T = 25°C unless otherwise noted
C
Symbol
Parameter
FQB22P10 / FQI22P10
Unit
V
V
I
Drain-Source Voltage
-100
-22
DSS
- Continuous (T = 25°C)
Drain Current
A
D
C
- Continuous (T = 100°C)
-15.6
-88
A
C
I
(Note 1)
Drain Current
- Pulsed
A
DM
V
E
I
Gate-Source Voltage
±30
V
GSS
(Note 2)
(Note 1)
(Note 1)
(Note 3)
Single Pulsed Avalanche Energy
Avalanche Current
710
mJ
A
AS
-22
AR
E
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
12.5
mJ
V/ns
W
AR
dv/dt
-6.0
Power Dissipation (T = 25°C) *
3.75
P
A
D
Power Dissipation (T = 25°C)
125
W
C
- Derate above 25°C
Operating and Storage Temperature Range
0.83
W/°C
°C
T , T
-55 to +175
J
STG
Maximum lead temperature for soldering purposes,
T
300
°C
L
1/8" from case for 5 seconds
Thermal Characteristics
Symbol
Parameter
Typ
--
Max
1.2
Unit
R
R
R
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient *
Thermal Resistance, Junction-to-Ambient
°C/W
°C/W
°C/W
θJC
θJA
θJA
--
40
--
62.5
* When mounted on the minimum pad size recommended (PCB Mount)
©2000 Fairchild Semiconductor Corporation
FQB22P10 / FQI22P10 Rev. C2
www.fairchildsemi.com