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FQB1P50TM PDF预览

FQB1P50TM

更新时间: 2024-11-02 12:28:43
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
9页 726K
描述
P-Channel QFET MOSFET - 500 V, - 1.5 A, 10.5 Ohm

FQB1P50TM 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:D2PAK
包装说明:SMALL OUTLINE, R-PSSO-G2针数:2
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8541.29.00.95风险等级:5.34
雪崩能效等级(Eas):110 mJ外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:500 V
最大漏极电流 (Abs) (ID):1.5 A最大漏极电流 (ID):1.5 A
最大漏源导通电阻:10.5 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:TO-263ABJESD-30 代码:R-PSSO-G2
JESD-609代码:e3湿度敏感等级:1
元件数量:1端子数量:2
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):245
极性/信道类型:P-CHANNEL最大功率耗散 (Abs):63 W
最大脉冲漏极电流 (IDM):6 A认证状态:Not Qualified
子类别:Other Transistors表面贴装:YES
端子面层:Matte Tin (Sn)端子形式:GULL WING
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQB1P50TM 数据手册

 浏览型号FQB1P50TM的Datasheet PDF文件第2页浏览型号FQB1P50TM的Datasheet PDF文件第3页浏览型号FQB1P50TM的Datasheet PDF文件第4页浏览型号FQB1P50TM的Datasheet PDF文件第5页浏览型号FQB1P50TM的Datasheet PDF文件第6页浏览型号FQB1P50TM的Datasheet PDF文件第7页 
April 2013  
FQB1P50 / FQI1P50  
P-Channel QFET® MOSFET  
- 500 V, - 1.5 A, 10.5 Ω  
Description  
Features  
- 1.5 A, - 500 V, R  
ID = - 0.75 A  
= 10.5 (Max.) @ V = - 10 V,  
This P-Channel enhancement mode power MOSFET is  
produced using Fairchild Semiconductor®’s proprietary  
planar stripe and DMOS technology. This advanced  
MOSFET technology has been especially tailored to  
reduce on-state resistance, and to provide superior  
switching performance and high avalanche energy  
strength. These devices are suitable for switched mode  
power supplies, active power factor correction (PFC), and  
electronic lamp ballasts.  
DS(on)  
GS  
Low Gate Charge (Typ. 11 nC)  
Low Crss (Typ. 6.0 pF)  
100% Avalanche Tested  
RoHS Compliant  
S
!
D
G!  
G
G
D
S
S
D2-PAK  
I-PAK  
!
D
Absolute Maximum Ratings  
T = 25°C unless otherwise noted  
C
Symbol  
Parameter  
FQB1P50 / FQI1P50  
Unit  
V
V
I
Drain-Source Voltage  
-500  
-1.5  
DSS  
- Continuous (T = 25°C)  
Drain Current  
A
D
C
- Continuous (T = 100°C)  
-0.95  
-6.0  
A
C
I
(Note 1)  
Drain Current  
- Pulsed  
A
DM  
V
E
I
Gate-Source Voltage  
± 30  
V
GSS  
AS  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
110  
mJ  
A
-1.5  
AR  
E
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
6.3  
mJ  
V/ns  
W
AR  
dv/dt  
-4.5  
Power Dissipation (T = 25°C) *  
3.13  
P
A
D
Power Dissipation (T = 25°C)  
63  
W
C
- Derate above 25°C  
Operating and Storage Temperature Range  
0.51  
W/°C  
°C  
T , T  
-55 to +150  
J
STG  
Maximum lead temperature for soldering purposes,  
1/8from case for 5 seconds  
T
300  
°C  
L
Thermal Characteristics  
FQB1P50 / FQI1P50  
Symbol  
Parameter  
Unit  
R
R
R
Thermal Resistance, Junction-to-Case, Max.  
Thermal Resistance, Junction-to-Ambient *  
Thermal Resistance, Junction-to-Ambient, Max.  
1.98  
40  
°C/W  
°C/W  
°C/W  
θJC  
θJA  
θJA  
62.5  
* When mounted on the minimum pad size recommended (PCB Mount)  
www.fairchildsemi.com  
©2008 Fairchild Semiconductor Corporation  
1
FQB1P50 / FQI1P50 Rev. C0  

FQB1P50TM 替代型号

型号 品牌 替代类型 描述 数据表
FQB1P50TM ONSEMI

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功率 MOSFET,P 沟道,QFET®,-500 V,-1.5 A,10.5 Ω,D2P

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