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FQA13N80_F109 PDF预览

FQA13N80_F109

更新时间: 2024-11-05 03:37:39
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
9页 826K
描述
800V N-Channel MOSFET

FQA13N80_F109 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:TO-3PN
包装说明:FLANGE MOUNT, R-PSFM-T3针数:3
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8541.29.00.95风险等级:4.47
雪崩能效等级(Eas):1100 mJ配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:800 V最大漏极电流 (Abs) (ID):12.6 A
最大漏极电流 (ID):12.6 A最大漏源导通电阻:0.75 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PSFM-T3
JESD-609代码:e3元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):300 W最大脉冲漏极电流 (IDM):50.4 A
认证状态:Not Qualified子类别:FET General Purpose Powers
表面贴装:NO端子面层:Matte Tin (Sn)
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

FQA13N80_F109 数据手册

 浏览型号FQA13N80_F109的Datasheet PDF文件第2页浏览型号FQA13N80_F109的Datasheet PDF文件第3页浏览型号FQA13N80_F109的Datasheet PDF文件第4页浏览型号FQA13N80_F109的Datasheet PDF文件第5页浏览型号FQA13N80_F109的Datasheet PDF文件第6页浏览型号FQA13N80_F109的Datasheet PDF文件第7页 
September 2006  
®
QFET  
FQA13N80  
800V N-Channel MOSFET  
Features  
Description  
12.6A, 800V, RDS(on) = 0.75@VGS = 10 V  
Low gate charge ( typical 68 nC)  
Low Crss ( typical 30pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficient switched mode power supplies, active power factor  
correction, electronic lamp ballast based on half bridge  
topology.  
D
G
TO-3P  
FQA Series  
G D S  
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FQA13N80  
800  
Units  
V
VDSS  
ID  
Drain-Source Voltage  
Drain Current  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
12.6  
A
8.0  
A
(Note 1)  
IDM  
Drain Current  
50.4  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
± 30  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
1100  
12.6  
mJ  
A
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TC = 25°C)  
30  
mJ  
V/ns  
W
4.0  
300  
- Derate above 25°C  
2.38  
W/°C  
°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Symbol  
Parameter  
Typ  
--  
Max  
0.42  
--  
Units  
°C/W  
°C/W  
°C/W  
RθJC  
RθCS  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Case-to-Sink  
0.24  
--  
Thermal Resistance, Junction-to-Ambient  
40  
©2006 Fairchild Semiconductor Corporation  
FQA13N80 Rev. A1  
1
www.fairchildsemi.com  

FQA13N80_F109 替代型号

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