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FGY4L140T120SWD PDF预览

FGY4L140T120SWD

更新时间: 2024-04-09 19:00:55
品牌 Logo 应用领域
安森美 - ONSEMI 双极性晶体管
页数 文件大小 规格书
9页 337K
描述
IGBT – Power, Co-PAK N-Channel, Field Stop VII (FS7), TO247-4L 1200 V, 1.7 V, 140 A

FGY4L140T120SWD 数据手册

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DATA SHEET  
www.onsemi.com  
IGBT – Power, Co-PAK  
N-Channel, Field Stop VII  
BV  
V
I
C
CES  
CE(SAT)_TYP  
1200 V  
1.7 V  
140 A  
(FS7), TO247-4L  
1200 V, 1.7 V, 140 A  
PIN CONNECTIONS  
FGY4L140T120SWD  
Description  
Using the novel field stop 7th generation IGBT technology and the  
Gen7 Diode in TO247 4lead package, FGY4L140T120SWD offers  
the optimum performance with low switching and conduction losses  
for highefficiency operations in various applications like Solar  
Inverter, UPS and ESS.  
Features  
Maximum Junction Temperature T = 175°C  
J
Positive Temperature Coefficient for Easy Parallel Operation  
High Current Capability  
C
E
Es  
G
Smooth and Optimized Switching  
Low Switching Loss  
TO2474LD  
CASE 340BW  
RoHS Compliant  
Applications  
MARKING DIAGRAM  
Solar Inverter  
UPS  
Energy Storage System  
AYWWZZ  
Y4L140  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Parameter  
CollectortoEmitter Voltage  
GatetoEmitter Voltage  
Symbol  
Value  
1200  
20  
Unit  
120SWD  
V
CE  
V
V
GE  
Transient GatetoEmitter Voltage  
30  
T
T
T
T
T
= 25°C (Note 1)  
= 100°C  
200  
140  
1250  
625  
560  
Collector Current  
I
A
W
A
C
C
C
C
C
C
= 25°C  
Power Dissipation  
P
D
A
YWW  
ZZ  
= Assembly Location  
= Date code (Year & week)  
= Assembly Lot  
= 100°C  
Pulsed Collector  
Current  
= 25°C,  
t = 10 ms (Note 2)  
I
CM  
Y4L140120SWD = Specific Device Code  
p
T
T
T
= 25°C (Note 1)  
= 100°C  
200  
140  
560  
Diode Forward  
Current  
I
C
C
C
F
ORDERING INFORMATION  
Pulsed Diode Forward  
Current  
= 25°C,  
t = 10 ms (Note 2)  
I
FM  
Device  
Package  
Shipping  
p
FGY4L140T120SWD TO2474LD  
(PbFree)  
30 Units /  
Tube  
Operating Junction and Storage Temperature  
Range  
T , T  
55 to  
+175  
°C  
J
stg  
Lead Temperature for Soldering Purposes  
T
L
265  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. Value limited by bond wire  
2. Repetitive rating: Pulse width limited by max. junction temperature.  
© Semiconductor Components Industries, LLC, 2023  
1
Publication Order Number:  
March, 2024 Rev. 2  
FGY4L140T120SWD/D  
 

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