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FDB2532-SB82254 PDF预览

FDB2532-SB82254

更新时间: 2024-11-15 19:41:47
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 275K
描述
Transistor

FDB2532-SB82254 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:,Reach Compliance Code:unknown
风险等级:5.84Base Number Matches:1

FDB2532-SB82254 数据手册

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August 2002  
FDB2532 / FDP2532 / FDI2532  
N-Channel PowerTrench® MOSFET  
150V, 79A, 16mΩ  
Features  
Applications  
rDS(ON) = 14m(Typ.), VGS = 10V, ID = 33A  
Qg(tot) = 82nC (Typ.), VGS = 10V  
Low Miller Charge  
DC/DC converters and Off-Line UPS  
Distributed Power Architectures and VRMs  
Primary Switch for 24V and 48V Systems  
High Voltage Synchronous Rectifier  
Direct Injection / Diesel Injection Systems  
42V Automotive Load Control  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
Formerly developmental type 82884  
Electronic Valve Train Systems  
D
DRAIN  
(FLANGE)  
SOURCE  
DRAIN  
(FLANGE)  
DRAIN  
SOURCE  
DRAIN  
GATE  
GATE  
GATE  
SOURCE  
G
TO-220AB  
FDP SERIES  
DRAIN  
(FLANGE)  
TO-262AB  
FDI SERIES  
TO-263AB  
FDB SERIES  
S
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
150  
V
V
±20  
Continuous (TC = 25oC, VGS = 10V)  
Continuous (TC = 100oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, RθJA = 43oC/W)  
Pulsed  
79  
56  
A
A
ID  
8
A
Figure 4  
400  
A
EAS  
Single Pulse Avalanche Energy (Note 1)  
mJ  
Power dissipation  
Derate above 25oC  
310  
W
PD  
2.07  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-220, TO-263, TO-262  
Thermal Resistance Junction to Ambient TO-220, TO-262 (Note 2)  
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area  
0.48  
62  
oC/W  
oC/W  
oC/W  
43  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2002 Fairchild Semiconductor Corporation  
FDB2532 / FDP2532 / FDI2532 Rev. B  

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