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F59L4G81XB PDF预览

F59L4G81XB

更新时间: 2024-11-15 02:51:27
品牌 Logo 应用领域
晶豪 - ESMT /
页数 文件大小 规格书
87页 2290K
描述
4 Gbit (512M x 8) 3.3V NAND Flash Memory

F59L4G81XB 数据手册

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ESMT  
F59L4G81XB (2X)  
Flash  
4 Gbit (512M x 8)  
3.3V NAND Flash Memory  
FEATURES  
Operating voltage range  
VCC: 2.73.6V  
Open NAND Flash Interface (ONFI) 1.0-compliant1  
Single-level cell (SLC) technology  
Organization  
Operation status byte provides software method for  
detecting  
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Operation completion  
Pass/Fail condition  
Write-protect status  
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­
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Page size: 4352 bytes (4096 + 256 bytes)  
Block size: 64 pages  
Number of planes: 1  
Ready/Busy# (R/B#) signal provides a hardware method  
of detecting operation completion  
WP# signal: Write protect entire device  
ECC: 8-bit internal ECC is disabled at default2. It can be  
toggled using the SET FEATURE command  
Blocks 0 is valid when shipped from factory with ECC. For  
minimum required ECC, see Error Management.  
RESET (FFh) required as first command after power- on.  
Internal data move operations supported within the plane  
from which data is read  
Asynchronous I/O performance  
tRC/tWC: 25ns  
Array performance  
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­
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Read page: 115μs (MAX) with on-die ECC enabled  
Read page: 25μs (MAX) with on-die ECC disabled  
Program page: 200μs (TYP) with on-die ECC  
disabled  
Quality and reliability  
­
­
Program page: 240μs (TYP) with on-die ECC enabled  
Erase block: 2ms (TYP)  
­
Endurance: 100,000 PROGRAM/ERASE cycles  
­
Data retention: JESD47G-compliant; see qualification  
report  
Command set: ONFI NAND Flash protocol  
Advanced command set  
­
Additional: Uncycled data retention: 10 years 24/7 @  
70°C  
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Program page cache mode  
Read page cache mode  
Permanent block locking (blocks 47:0)  
One-time programmable (OTP) mode  
Block lock  
Programmable drive strength  
Read unique ID  
Internal data move  
ORDERING INFORMATION  
Product ID  
Speed  
25 ns  
25 ns  
25 ns  
Package  
Comments  
Pb-free  
F59L4G81XB -25TG2X  
F59L4G81XB -25BG2X  
F59L4G81XB -25BCG2X  
48 pin TSOPI  
63 ball BGA  
67 ball BGA  
Pb-free  
Pb-free  
GENERAL DESCRIPTION  
NAND Flash devices include an asynchronous data interface for high-performance I/O operations. These devices use a highly  
multiplexed 8-bit bus (I/Ox) to transfer commands, address, and data. There are five control signals used to implement the  
asynchronous data interface: CE#, CLE, ALE, WE#, and RE#. Additional signals control hardware write protection and monitor device  
status (R/B#).  
This hardware interface creates a low pin-count device with a standard pinout that remains the same from one density to another,  
enabling future upgrades to higher densities with no board redesign.  
A target is the unit of memory accessed by a chip enable signal. A target contains one or more NAND Flash die. An NAND Flash die is  
the minimum unit that can independently execute commands and report status. An NAND Flash die, in the ONFI specification, is  
referred to as a logical unit (LUN). There is at least one NAND Flash die per chip enable signal. For further details, see Device and  
Array Organization.  
Elite Semiconductor Memory Technology Inc.  
Publication Date: Mar. 2019  
Revision: 1.0 1/87  

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