ESMT
F59L4G81XB (2X)
Flash
4 Gbit (512M x 8)
3.3V NAND Flash Memory
FEATURES
Operating voltage range
VCC: 2.7–3.6V
Open NAND Flash Interface (ONFI) 1.0-compliant1
Single-level cell (SLC) technology
Organization
Operation status byte provides software method for
detecting
Operation completion
Pass/Fail condition
Write-protect status
Page size: 4352 bytes (4096 + 256 bytes)
Block size: 64 pages
Number of planes: 1
Ready/Busy# (R/B#) signal provides a hardware method
of detecting operation completion
WP# signal: Write protect entire device
ECC: 8-bit internal ECC is disabled at default2. It can be
toggled using the SET FEATURE command
Blocks 0 is valid when shipped from factory with ECC. For
minimum required ECC, see Error Management.
RESET (FFh) required as first command after power- on.
Internal data move operations supported within the plane
from which data is read
Asynchronous I/O performance
tRC/tWC: 25ns
Array performance
Read page: 115μs (MAX) with on-die ECC enabled
Read page: 25μs (MAX) with on-die ECC disabled
Program page: 200μs (TYP) with on-die ECC
disabled
Quality and reliability
Program page: 240μs (TYP) with on-die ECC enabled
Erase block: 2ms (TYP)
Endurance: 100,000 PROGRAM/ERASE cycles
Data retention: JESD47G-compliant; see qualification
report
Command set: ONFI NAND Flash protocol
Advanced command set
Additional: Uncycled data retention: 10 years 24/7 @
70°C
Program page cache mode
Read page cache mode
Permanent block locking (blocks 47:0)
One-time programmable (OTP) mode
Block lock
Programmable drive strength
Read unique ID
Internal data move
ORDERING INFORMATION
Product ID
Speed
25 ns
25 ns
25 ns
Package
Comments
Pb-free
F59L4G81XB -25TG2X
F59L4G81XB -25BG2X
F59L4G81XB -25BCG2X
48 pin TSOPI
63 ball BGA
67 ball BGA
Pb-free
Pb-free
GENERAL DESCRIPTION
NAND Flash devices include an asynchronous data interface for high-performance I/O operations. These devices use a highly
multiplexed 8-bit bus (I/Ox) to transfer commands, address, and data. There are five control signals used to implement the
asynchronous data interface: CE#, CLE, ALE, WE#, and RE#. Additional signals control hardware write protection and monitor device
status (R/B#).
This hardware interface creates a low pin-count device with a standard pinout that remains the same from one density to another,
enabling future upgrades to higher densities with no board redesign.
A target is the unit of memory accessed by a chip enable signal. A target contains one or more NAND Flash die. An NAND Flash die is
the minimum unit that can independently execute commands and report status. An NAND Flash die, in the ONFI specification, is
referred to as a logical unit (LUN). There is at least one NAND Flash die per chip enable signal. For further details, see Device and
Array Organization.
Elite Semiconductor Memory Technology Inc.
Publication Date: Mar. 2019
Revision: 1.0 1/87