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EVAL-AD5522EBDZ

更新时间： 2024-09-30 06:58:07
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亚德诺 - ADI /
页数 文件大小 规格书
60页 1343K
描述
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs

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EVAL-AD5522EBDZ 数据手册

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Quad Parametric Measurement Unit with  
Integrated 16-Bit Level Setting DACs  
AD5522  
FEATURES  
APPLICATIONS  
Quad parametric measurement unit (PMU)  
FV, FI, FN (high-Z), MV, MI functions  
4 programmable current ranges (internal RSENSE  
±± ꢀA, ±20 ꢀA, ±200 ꢀA, and ±2 mA  
Automated test equipment (ATE)  
Per-pin parametric measurement unit  
Continuity and leakage testing  
Device power supply  
)
1 programmable current range up to ±80 mA (external RSENSE  
22.± V FV range with asymmetrical operation  
Integrated 16-bit DACs provide programmable levels  
Gain and offset correction on chip  
)
Instrumentation  
Source measure unit (SMU)  
Precision measurement  
Low capacitance outputs suited to relayless systems  
On-chip comparators per channel  
FI voltage clamps and FV current clamps  
Guard drive amplifier  
System PMU connections  
Programmable temperature shutdown  
SPI- and LVDS-compatible interfaces  
Compact 80-lead TQFP with exposed pad (top or bottom)  
FUNCTIONAL BLOCK DIAGRAM  
DVCC  
DGND  
CCOMP[0:3]  
SYS_FORCE  
SYS_SENSE  
AVSS  
AVDD  
AGND  
EN  
EXTFOH[0:3]  
VREF  
×4  
16-BIT  
CLH DAC  
16  
16  
16  
16  
CFF[0:3]  
FOH[0:3]  
X1 REG  
M REG  
C REG  
CLH  
SW3  
X2 REG  
×2  
REFGND  
×2  
OFFSET DAC  
INTERNAL RANGE SELECT  
(±5µA, ±20µA, ±200µA, ±2mA)  
16  
–
+
60Ω  
1kΩ  
FIN  
16  
16  
×6  
SW1  
16-BIT  
FIN DAC  
X1 REG  
M REG  
C REG  
16  
+
FORCE  
AMPLIFIER  
AGND  
X2 REG  
MEASVH  
(Hi-Z)  
×6  
SW5  
R
–
SENSE  
SW2  
4kΩ  
SW6  
SW4  
16-BIT  
CLL DAC  
16  
16  
16  
16  
EXTMEASIH[0:3]  
EXTMEASIL[0:3]  
CLL  
+
X1 REG  
M REG  
C REG  
X2 REG  
VMID TO  
CENTER  
I RANGE  
×2  
+
–
EXTERNAL  
SW8  
SW10  
×2  
R
SENSE  
2kΩ  
(CURRENTS  
UP TO ±80mA)  
SW7  
×5 or ×10  
MEASOUT  
MUX AND GAIN  
×1/×0.2  
+
–
–
MEASOUT[0:3]  
AGND  
SW9  
4kΩ  
SW12  
TEMP  
SENSOR  
MEASURE  
CURRENT  
IN-AMP  
16  
16  
16  
SW11  
MEASVH[0:3]  
GUARD[0:3]  
×6  
X1 REG  
M REG  
C REG  
×6  
+
–
16-BIT  
CPH DAC  
16  
X2 REG  
SW13  
DUT  
AGND  
+
GUARDIN[0:3]/  
DUTGND[0:3]  
SW16  
GUARD AMP  
×1  
16  
16  
16  
DUTGND  
CPH  
–
×6  
+
–
×6  
–
SW14  
CPL  
16-BIT  
DUTGND  
X1 REG  
M REG  
C REG  
16  
CPL DAC  
X2 REG  
MEASURE  
VOLTAGE  
IN-AMP  
+
–
+
SW15  
COMPARATOR  
10kΩ  
AGND  
16-BIT  
OFFSET  
DAC  
TO ALL DAC  
OUTPUT  
AMPLIFIERS  
TO  
MEASOUT  
MUX  
16  
TEMP  
SENSOR  
TMPALM  
CGALM  
16  
SERIAL  
INTERFACE  
CLAMP AND  
GUARD  
ALARM  
POWER-ON  
RESET  
RESET SDO SCLK SDI SYNC BUSY LOAD SPI/ CPOL0/ CPOH0/  
LVDS SCLK  
SDI  
CPOL1/ CPOH1/  
SYNC SDO  
CPOL2/ CPOH2/ CPOL3/ CPOH3/  
CPO0 CPO1 CPO2 CPO3  
Figure 1.  
Rev. A  
Information furnished by Analog Devices is believed to be accurate and reliable. However, no  
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other  
rights of third parties that may result from its use. Specifications subject to change without notice. No  
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.  
Trademarks and registeredtrademarks arethe property of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
Fax: 781.461.3113  
www.analog.com  
©2008 Analog Devices, Inc. All rights reserved.  
 
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