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EP20K1000CF672C-8 PDF预览

EP20K1000CF672C-8

更新时间: 2024-02-12 23:33:45
品牌 Logo 应用领域
英特尔 - INTEL LTE输入元件可编程逻辑
页数 文件大小 规格书
94页 780K
描述
LOADABLE PLD, 1.79ns, PBGA672, 27 X 27 MM, 1 MM PITCH, FBGA-672

EP20K1000CF672C-8 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active零件包装代码:BGA
包装说明:27 X 27 MM, 1 MM PITCH, FBGA-672针数:672
Reach Compliance Code:compliant风险等级:5.12
JESD-30 代码:S-PBGA-B672JESD-609代码:e0
长度:27 mm专用输入次数:4
I/O 线路数量:508端子数量:672
最高工作温度:85 °C最低工作温度:
组织:4 DEDICATED INPUTS, 508 I/O输出函数:MACROCELL
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装形状:SQUARE封装形式:GRID ARRAY
峰值回流温度(摄氏度):220可编程逻辑类型:LOADABLE PLD
传播延迟:1.79 ns认证状态:Not Qualified
座面最大高度:3.5 mm最大供电电压:1.89 V
最小供电电压:1.71 V标称供电电压:1.8 V
表面贴装:YES温度等级:OTHER
端子面层:TIN LEAD端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:30宽度:27 mm
Base Number Matches:1

EP20K1000CF672C-8 数据手册

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APEX 20KC  
Programmable Logic  
Device  
®
February 2004 ver. 2.2  
Data Sheet  
Programmable logic device (PLD) manufactured using a 0.15-µm all-  
Features...  
layer copper-metal fabrication process  
25 to 35% faster design performance than APEXTM 20KE devices  
Pin-compatible with APEX 20KE devices  
High-performance, low-power copper interconnect  
MultiCoreTM architecture integrating look-up table (LUT) logic  
and embedded memory  
LUT logic used for register-intensive functions  
Embedded system blocks (ESBs) used to implement memory  
functions, including first-in first-out (FIFO) buffers, dual-port  
RAM, and content-addressable memory (CAM)  
High-density architecture  
200,000 to 1 million typical gates (see Table 1)  
Up to 38,400 logic elements (LEs)  
Up to 327,680 RAM bits that can be used without reducing  
available logic  
Table 1. APEX 20KC Device Features  
Note (1)  
Feature  
EP20K200C  
EP20K400C  
EP20K600C  
EP20K1000C  
Maximum system gates  
Typical gates  
526,000  
200,000  
8,320  
52  
1,052,000  
400,000  
16,640  
104  
1,537,000  
600,000  
24,320  
152  
1,772,000  
1,000,000  
38,400  
160  
LEs  
ESBs  
Maximum RAM bits  
PLLs (2)  
106,496  
2
212,992  
4
311,296  
4
327,680  
4
Speed grades (3)  
Maximum macrocells  
Maximum user I/O pins  
-7, -8, -9  
832  
-7, -8, -9  
1,664  
-7, -8, -9  
2,432  
-7, -8, -9  
2,560  
376  
488  
588  
708  
Notes to Table 1:  
(1) The embedded IEEE Std. 1149.1 Joint Test Action Group (JTAG) boundary-scan circuitry contributes up to  
57,000 additional gates.  
(2) PLL: phase-locked loop.  
(3) The -7 speed grade provides the fastest performance.  
Altera Corporation  
1
DS-APEX20KC-2.2  

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