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EN29LV800AB-55RTC PDF预览

EN29LV800AB-55RTC

更新时间: 2024-11-16 05:10:27
品牌 Logo 应用领域
EON 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
41页 591K
描述
8 Megabit (1024K x 8-bit / 512K x 16-bit) Flash Memory Boot Sector Flash Memory, CMOS 3.0 Volt-only

EN29LV800AB-55RTC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
Reach Compliance Code:unknown风险等级:5.92
Is Samacsys:N最长访问时间:55 ns
备用内存宽度:8启动块:BOTTOM
命令用户界面:YES数据轮询:YES
耐久性:1000000 Write/Erase CyclesJESD-30 代码:R-PDSO-G48
JESD-609代码:e0内存密度:8388608 bit
内存集成电路类型:FLASH内存宽度:16
部门数/规模:1,2,1,15端子数量:48
字数:524288 words字数代码:512000
最高工作温度:70 °C最低工作温度:
组织:512KX16封装主体材料:PLASTIC/EPOXY
封装代码:TSSOP封装等效代码:TSSOP48,.8,20
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
并行/串行:PARALLEL电源:3.3 V
认证状态:Not Qualified就绪/忙碌:YES
部门规模:16K,8K,32K,64K最大待机电流:0.000005 A
子类别:Flash Memories最大压摆率:0.03 mA
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
Base Number Matches:1

EN29LV800AB-55RTC 数据手册

 浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第2页浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第3页浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第4页浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第5页浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第6页浏览型号EN29LV800AB-55RTC的Datasheet PDF文件第7页 
EN29LV800A  
EN29LV800A  
8 Megabit (1024K x 8-bit / 512K x 16-bit) Flash Memory  
Boot Sector Flash Memory, CMOS 3.0 Volt-only  
FEATURES  
Additionally, temporary Sector Unprotect  
allows code changes in previously locked  
sectors.  
Single power supply operation  
- Full voltage range: 2.7-3.6 volt read and write  
operations for battery-powered applications.  
- Regulated voltage range: 3.0-3.6 volt read  
and write operations and for compatibility with  
high performance 3.3 volt microprocessors.  
High performance program/erase speed  
- Byte/Word program time: 8µs typical  
- Sector erase time: 500ms typical  
Manufactured on 0.18 µm triple-metal double  
poly triple-well CMOS Flash Technology  
JEDEC Standard Embedded Erase and  
Program Algorithms  
JEDEC standard DATA# polling and toggle  
bits feature  
High performance  
- Access times as fast as 55 ns  
Single Sector and Chip Erase  
Sector Unprotect Mode  
Low power consumption (typical values at 5  
MHz)  
- 7 mA typical active read current  
- 15 mA typical program/erase current  
- 1 µA typical standby current (standard access  
time to active mode)  
Erase Suspend / Resume modes:  
Read or program another Sector during  
Erase Suspend Mode  
Low Vcc write inhibit < 2.5V  
Minimum 1,000K endurance cycle  
Package Options  
Flexible Sector Architecture:  
- One 16-Kbyte, two 8-Kbyte, one 32-Kbyte,  
and fifteen 64-Kbyte sectors (byte mode)  
- One 8-Kword, two 4-Kword, one 16-Kword  
and fifteen 32-Kword sectors (word mode)  
- 48-pin TSOP (Type 1)  
- 48-ball 6mm x 8mm FBGA  
Sector protection:  
Commercial and industrial temperature  
Range  
- Hardware locking of sectors to prevent  
program or erase operations within individual  
sectors  
GENERAL DESCRIPTION  
The EN29LV800A is an 8-Megabit, electrically erasable, read/write non-volatile flash memory,  
organized as 1,048,576 bytes or 524,288 words. Any byte can be programmed typically in 8µs.  
The EN29LV800A features 3.0V voltage read and write operation, with access time as fast as 55ns  
to eliminate the need for WAIT statements in high-performance microprocessor systems.  
The EN29LV800A has separate Output Enable (OE#), Chip Enable (CE#), and Write Enable (WE#)  
controls, which eliminate bus contention issues. This device is designed to allow either single  
Sector or full chip erase operation, where each sector can be individually protected against  
program/erase operations or temporarily unprotected to erase or program. The device can sustain  
a minimum of 1,000K program/erase cycles on each sector.  
This Data Sheet may be revised by subsequent versions  
or modifications due to changes in technical specifications.  
©2004 Eon Silicon Solution, Inc., www.essi.com.tw  
1
Rev. C, Issue Date: 2005/01/10  

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