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EN29LV512-55SCP PDF预览

EN29LV512-55SCP

更新时间: 2024-01-22 11:51:07
品牌 Logo 应用领域
EON 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
35页 401K
描述
512 Kbit (64K x 8-bit ) Uniform Sector, CMOS 3.0 Volt-only Flash Memory

EN29LV512-55SCP 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:TSSOP, TSSOP32,.8,20Reach Compliance Code:unknown
风险等级:5.84Is Samacsys:N
最长访问时间:55 ns命令用户界面:YES
数据轮询:YESJESD-30 代码:R-PDSO-G32
内存密度:524288 bit内存集成电路类型:FLASH
内存宽度:8部门数/规模:4
端子数量:32字数:65536 words
字数代码:64000最高工作温度:85 °C
最低工作温度:-40 °C组织:64KX8
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装等效代码:TSSOP32,.8,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH并行/串行:PARALLEL
电源:3/3.3 V认证状态:Not Qualified
部门规模:16K最大待机电流:0.000005 A
子类别:Flash Memories最大压摆率:0.03 mA
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
Base Number Matches:1

EN29LV512-55SCP 数据手册

 浏览型号EN29LV512-55SCP的Datasheet PDF文件第2页浏览型号EN29LV512-55SCP的Datasheet PDF文件第3页浏览型号EN29LV512-55SCP的Datasheet PDF文件第4页浏览型号EN29LV512-55SCP的Datasheet PDF文件第5页浏览型号EN29LV512-55SCP的Datasheet PDF文件第6页浏览型号EN29LV512-55SCP的Datasheet PDF文件第7页 
EN29LV512  
EN29LV512  
512 Kbit (64K x 8-bit ) Uniform Sector,  
CMOS 3.0 Volt-only Flash Memory  
FEATURES  
Single power supply operation  
High performance program/erase speed  
- Full voltage range: 2.7-3.6 volt read and write  
operations for battery-powered applications.  
- Regulated voltage range: 3.0-3.6 volt read  
and write operations for high performance  
3.3 volt microprocessors.  
- Byte program time: 8µs typical  
- Sector erase time: 500ms typical  
JEDEC Standard program and erase  
commands  
JEDEC standard  
polling and toggle bits  
DATA  
High performance  
feature  
- Full voltage range: access times as fast as 55  
ns  
Single Sector and Chip Erase  
- Regulated voltage range: access times as fast  
as 45ns  
Embedded Erase and Program Algorithms  
Low power consumption (typical values at 5  
MHz)  
Erase Suspend / Resume modes:  
Read or program another Sector during  
Erase Suspend Mode  
- 7 mA typical active read current  
- 15 mA typical program/erase current  
- 1 µA typical standby current (standard access  
time to active mode)  
triple-metal double-poly triple-well CMOS Flash  
Technology  
Low Vcc write inhibit < 2.5V  
Flexible Sector Architecture:  
- Four 16 Kbyte sectors  
>100K program/erase endurance cycle  
- Supports full chip erase  
Package options  
-
- Individual sector erase supported  
- Sector protection and unprotection:  
Hardware locking of sectors to prevent  
program or erase operations within individual  
sectors  
- 8mm x 20mm 32-pin TSOP (Type 1)  
- 8mm x 14mm 32-pin TSOP (Type 1)  
- 32-pin PLCC  
Commercial and industrial Temperature Range  
GENERAL DESCRIPTION  
The EN29LV512 is a 512-Kbit, electrically erasable, read/write non-volatile flash memory, organized  
as 65,536 bytes. Any byte can be programmed typically in 8µs. The EN29LV512 features 3.0V  
voltage read and write operation, with access times as fast as 45ns to eliminate the need for WAIT  
states in high-performance microprocessor systems.  
The EN29LV512 has separate Output Enable (  
), Chip Enable (  
), and Write Enable (WE)  
CE  
OE  
controls, which eliminate bus contention issues. This device is designed to allow either single  
Sector or full chip erase operation, where each Sector can be individually protected against  
program/erase operations or temporarily unprotected to erase or program. The device can sustain a  
minimum of 100K program/erase cycles on each Sector.  
This Data Sheet may be revised by subsequent versions  
©2003 Eon Silicon Solution, Inc., www.essi.com.tw  
Rev. B, Issue Date: 2004/01/05  
1
or modifications due to changes in technical specifications.  

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