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EDE2108AASE-8G-E PDF预览

EDE2108AASE-8G-E

更新时间: 2024-11-07 20:07:23
品牌 Logo 应用领域
尔必达 - ELPIDA 动态存储器双倍数据速率
页数 文件大小 规格书
5页 56K
描述
DDR DRAM, 256MX8, CMOS, PBGA68, ROHS COMPLIANT, FBGA-68

EDE2108AASE-8G-E 技术参数

生命周期:Obsolete零件包装代码:BGA
包装说明:TFBGA,针数:68
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.36风险等级:5.83
访问模式:MULTI BANK PAGE BURST其他特性:AUTO/SELF REFRESH
JESD-30 代码:R-PBGA-B68JESD-609代码:e1
长度:20.7 mm内存密度:2147483648 bit
内存集成电路类型:DDR DRAM内存宽度:8
功能数量:1端口数量:1
端子数量:68字数:268435456 words
字数代码:256000000工作模式:SYNCHRONOUS
组织:256MX8封装主体材料:PLASTIC/EPOXY
封装代码:TFBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, THIN PROFILE, FINE PITCH认证状态:Not Qualified
座面最大高度:1.12 mm自我刷新:YES
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS端子面层:TIN SILVER COPPER
端子形式:BALL端子节距:0.8 mm
端子位置:BOTTOM宽度:10.2 mm
Base Number Matches:1

EDE2108AASE-8G-E 数据手册

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PRELIMINARY DATA SHEET  
2G bits DDR2 SDRAM  
EDE2104AASE (512M words × 4 bits)  
EDE2108AASE (256M words × 8 bits)  
Features  
Description  
The EDE2104AASE is a 2G bits DDR2 SDRAM  
Power supply: VDD, VDDQ = 1.8V ± 0.1V  
organized as 67,108,864 words × 4 bits × 8 banks.  
Double-data-rate architecture: two data transfers per  
clock cycle  
The EDE2108AASE is a 2G bits DDR2 SDRAM  
organized as 33,554,432 words × 8 bits × 8 banks.  
Bi-directional, differential data strobe (DQS and  
/DQS) is transmitted/received with data, to be used in  
capturing data at the receiver  
They are packaged in 68-ball FBGA package.  
DQS is edge aligned with data for READs: center-  
aligned with data for WRITEs  
Differential clock inputs (CK and /CK)  
DLL aligns DQ and DQS transitions with CK  
transitions  
Commands entered on each positive CK edge: data  
and data mask referenced to both edges of DQS  
8 internal banks for concurrent operation  
Data mask (DM) for write data  
Burst lengths: 4, 8  
/CAS Latency (CL): 3, 4, 5, 6  
Auto precharge operation for each burst access  
Auto refresh and self refresh modes  
Average refresh period  
7.8µs at 0°C TC ≤ +85°C  
3.9µs at +85°C < TC ≤ +95°C  
SSTL_18 compatible I/O  
Posted CAS by programmable additive latency for  
better command and data bus efficiency  
Off-Chip-Driver Impedance Adjustment and On-Die-  
Termination for better signal quality  
Programmable RDQS, /RDQS output for making × 8  
organization compatible to × 4 organization  
/DQS, (/RDQS) can be disabled for single-ended  
Data Strobe operation.  
Programmable Partial Array Self Refresh  
FBGA package with lead free solder (Sn-Ag-Cu)  
RoHs compliant  
Document No. E0757E11 (Ver. 1.1)  
Date Published February 2006 (K) Japan  
Printed in Japan  
URL: http://www.elpida.com  
Elpida Memory, Inc. 2005-2006  

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