Datasheet > EB52F3A15N-41.000M

EB52F3A15N-41.000M

更新时间： 2024-01-30 17:14:43

品牌	Logo	应用领域
日蚀 - ECLIPTEK		机械输出元件石英晶振温度补偿晶振振荡器
页数	文件大小	规格书
4页	154K
描述
TCXO, CLOCK, 41 MHz, LVCMOS OUTPUT, METAL, DIP-14/4

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技术参数
数据手册

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EB52F3A15N-41.000M 技术参数

生命周期：	Obsolete	Reach Compliance Code：	unknown
风险等级：	5.84	老化：	1 PPM/YEAR
最长下降时间：	10 ns	频率调整-机械：	YES
频率稳定性：	1.5%	安装特点：	THROUGH HOLE MOUNT
标称工作频率：	41 MHz	最高工作温度：	50 °C
最低工作温度：		振荡器类型：	LVCMOS
输出负载：	15 pF	物理尺寸：	18.3mm x 11.7mm x 4.8mm
最长上升时间：	10 ns	最大供电电压：	3.465 V
最小供电电压：	3.135 V	标称供电电压：	3.3 V
表面贴装：	NO	最大对称度：	60/40 %
Base Number Matches：	1

EB52F3A15N-41.000M 数据手册

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EB52F3A15N-41.000M

EB52F3 A 15 N -41.000M

Series

Nominal Frequency

3.3Vdc 14-Pin DIP LVCMOS TCXO

41.000MHz

Operating Temperature Range

0°C to +50°C

Control Voltage

None (No Connect on Pin 1)

Frequency Stability

±1.5ppm Maximum

ELECTRICAL SPECIFICATIONS

Nominal Frequency

41.000MHz

Frequency Stability

±1.5ppm Maximum (Inclusive of Operating Temperature Range)

Frequency Stability vs. Input Voltage ±0.3ppm Maximum (±5%)

Aging at 25°C

±1ppm/Year Maximum

Frequency Stability vs. Load

Operating Temperature Range

Supply Voltage

±0.2ppm Maximum (±2pF)

0°C to +50°C

3.3Vdc ±5%

Input Current

20mA Maximum

Output Voltage Logic High (Voh)

Output Voltage Logic Low (Vol)

Rise/Fall Time

90% of Vdd Minimum

10% of Vdd Maximum

10nSec Maximum (Measured at 20% to 80% of waveform)

50% ±10% (Measured at 50% of waveform)

15pF Maximum

Duty Cycle

Load Drive Capability

Output Logic Type

Control Voltage

CMOS

None (No Connect on Pin 1)

±3ppm Minimum (Top of Can)

10kHz Minimum (Measured at -3dB with a Control Voltage of 1.65Vdc)

10kOhms Typical

Internal Trim

Modulation Bandwidth

Input Impedance

Phase Noise

-70dBc at 10Hz Offset, -100dBc at 100Hz Offset, -130dBc at 1kHz Offset, -140dBc at 10kHz Offset, -

145dBc at 100kHz Offset

Storage Temperature Range

-40°C to +85°C

ENVIRONMENTAL & MECHANICAL SPECIFICATIONS

Fine Leak Test

MIL-STD-883, Method 1014 Condition A (Internal Crystal Only)

Gross Leak Test

Lead Integrity

MIL-STD-883, Method 1014 Condition C (Internal Crystal Only)

MIL-STD-883, Method 2004

Mechanical Shock

Resistance to Soldering Heat

Resistance to Solvents

Solderability

MIL-STD-202, Method 213 Condition C

MIL-STD-202, Method 210

MIL-STD-202, Method 215

MIL-STD-883, Method 2003

Temperature Cycling

Vibration

MIL-STD-883, Method 1010

MIL-STD-883, Method 2007 Condition A

www.ecliptek.com | Specification Subject to Change Without Notice | Rev C 2/16/2010 | Page 1 of 4

12 3 4

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