RoHS
Pb
EB52E8C3V-12.288M TR
EB52E8 C 3 V -12.288M TR
Series
Packaging Options
RoHS Compliant (Pb-free) 5mm x 7mm Ceramic SMD
3.3Vdc LVCMOS TC(VC)XO
Tape & Reel
Nominal Frequency
12.288MHz
Operating Temperature Range
-20°C to +70°C
Control Voltage
1.65Vdc ±1.65Vdc
Frequency Stability
±1.0ppm Maximum
ELECTRICAL SPECIFICATIONS
Nominal Frequency
Frequency Tolerance
Frequency Stability
12.288MHz
±1.0ppm Maximum (Measured at 25°C ±2°C, at Vdd=3.3Vdc and Vc=1.65Vdc)
±1.0ppm Maximum (Inclusive of Operating Temperature Range. Measured at Vdd=3.3Vdc and
Vc=1.65Vdc)
Frequency Stability vs. Input Voltage ±0.3ppm Maximum (±5%)
Frequency Stability vs. Aging
Frequency Stability vs. Load
Operating Temperature Range
Supply Voltage
±1ppm/year Maximum (at 25°C)
±0.3ppm Maximum (±10%)
-20°C to +70°C
3.3Vdc ±5%
Input Current
10mA Maximum
Output Voltage Logic High (Voh)
Output Voltage Logic Low (Vol)
Rise/Fall Time
90% of Vdd Minimum (IOH = -4mA)
10% of Vdd Maximum (IOL = +4mA)
5nSec Maximum (Measured at 20% to 80% of Waveform)
50 ±5(%) (Measured at 50% of Waveform)
15pF Maximum
Duty Cycle
Load Drive Capability
Output Logic Type
Control Voltage
CMOS
1.65Vdc ±1.65Vdc
Control Voltage Range
Frequency Deviation
Linearity
0.0Vdc to Vdd
±5ppm Minimum
5% Maximum
Transfer Function
Positive Transfer Characteristic
100kOhms Minimum
Input Impedance
Phase Noise
-80dBc/Hz at 10Hz Offset, -115dBc/Hz at 100Hz Offset, -135dBc/Hz at 1kHz Offset, and -145dBc/Hz at
>=10kHz Offset (Typical Values at 12.800MHz)
Tri-State Input Voltage (Vih and Vil)
+0.9Vdd Minimum to Enable Output; +0.1Vdd Maximum to Disable Output (High Impedance); No Connect
to Enable Output
RMS Phase Jitter
1pSec Maximum (Fj = 12kHz to 20MHz)
10mSec Maximum
Start Up Time
Storage Temperature Range
-40°C to +125°C
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
Fine Leak Test
MIL-STD-883, Method 1014 Condition A
MIL-STD-883, Method 1014 Condition C
MIL-STD-202, Method 213 Condition C
MIL-STD-202, Method 210
Gross Leak Test
Mechanical Shock
Resistance to Soldering Heat
Resistance to Solvents
Solderability
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
Temperature Cycling
Vibration
MIL-STD-883, Method 1010
MIL-STD-883, Method 2007 Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Rev C 3/11/2011 | Page 1 of 6