MUN2111T1 Series
Preferred Devices
Bias Resistor Transistors
PNP Silicon Surface Mount Transistors
with Monolithic Bias Resistor Network
This new series of digital transistors is designed to replace a single
device and its external resistor bias network. The
Bias Resistor Transistor (BRT) contains a single transistor with a
monolithic bias network consisting of two resistors; a series base
resistor and a base−emitter resistor. The BRT eliminates these
individual components by integrating them into a single device. The
use of a BRT can reduce both system cost and board space. The device
is housed in the SC−59 package which is designed for low power
surface mount applications.
• Simplifies Circuit Design
• Reduces Board Space
• Reduces Component Count
• Moisture Sensitivity Level: 1
• ESD Rating − Human Body Model: Class 1
ESD Rating − Machine Model: Class B
http://onsemi.com
PIN 3
COLLECTOR
(OUTPUT)
R1
R2
PIN 2
BASE
(INPUT)
PIN 1
EMITTER
(GROUND)
3
• The SC−59 package can be soldered using wave or reflow.
The modified gull−winged leads absorb thermal stress during
soldering eliminating the possibility of damage to the die.
• Pb−Free Package is Available
2
1
SC−59
CASE 318D
PLASTIC
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
A
MARKING DIAGRAM
Rating
Collector−Base Voltage
Collector−Emitter Voltage
Collector Current
Symbol
Value
50
Unit
Vdc
V
V
CBO
CEO
50
Vdc
6x M
I
100
mAdc
C
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
6x = Specific Device Code*
M = Date Code
Total Device Dissipation
P
230 (Note 1)
338 (Note 2)
1.8 (Note 1)
2.7 (Note 2)
mW
D
T = 25°C
A
Derate above 25°C
°C/W
°C/W
°C/W
°C
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
Thermal Resistance −
Junction−to−Ambient
R
q
JA
540 (Note 1)
370 (Note 2)
DEVICE MARKING INFORMATION
*See device marking table on page 2 of this data sheet.
Thermal Resistance −
Junction−to−Lead
R
q
JL
264 (Note 1)
287 (Note 2)
Junction and Storage
Temperature Range
T , T
−55 to +150
J
stg
Preferred devices are recommended choices for future use
and best overall value.
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. FR−4 @ Minimum Pad.
2. FR−4 @ 1.0 x 1.0 inch Pad.
Semiconductor Components Industries, LLC, 2005
Publication Order Number:
1
January, 2005 − Rev. 14
MUN2111T1/D