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DS96F174MJ-QMLV PDF预览

DS96F174MJ-QMLV

更新时间: 2024-11-12 03:02:03
品牌 Logo 应用领域
美国国家半导体 - NSC 线路驱动器或接收器驱动程序和接口接口集成电路
页数 文件大小 规格书
10页 224K
描述
RS-485 COMPARABLE QUAD DIFFERENTIAL DRIVER

DS96F174MJ-QMLV 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:CERDIP-16Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:5.39Is Samacsys:N
差分输出:YES驱动器位数:4
高电平输入电流最大值:0.00002 A输入特性:STANDARD
接口集成电路类型:LINE DRIVER接口标准:EIA-485
JESD-30 代码:R-GDIP-T16JESD-609代码:e0
长度:19.43 mm湿度敏感等级:1
功能数量:4端子数量:16
最高工作温度:125 °C最低工作温度:-55 °C
最小输出摆幅:1.2 V输出特性:3-STATE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DIP
封装等效代码:DIP16,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):260
电源:5 V认证状态:Not Qualified
最大接收延迟:筛选级别:MIL-PRF-38535 Class V
座面最大高度:5.08 mm子类别:Line Driver or Receivers
最大供电电压:5.5 V最小供电电压:4.5 V
标称供电电压:5 V表面贴装:NO
技术:BIPOLAR温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:40最大传输延迟:25 ns
宽度:7.62 mmBase Number Matches:1

DS96F174MJ-QMLV 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 06/19/95  
Last Update Date: 10/23/01  
MNDS96F174M-X REV 1B0  
Last Major Revision Date: 06/19/95  
RS-485 COMPARABLE QUAD DIFFERENTIAL DRIVER  
General Description  
The DS96F174 is a high speed quad differential line driver designed to meet EIA Standard  
RS-485. The DS96F174 offers improved performance due to the use of new, state-of-the-art  
L-FAST bipolar technology. The L-FAST technology allows for higher speeds and lower  
currents by utilizing extremely short gate delay times. Thus, the DS96F174 features lower  
power, extended temperature range, improved RS-485 specifications.  
The DS96F174 has wide positive and negative common mode range for multipoint applications  
in noisy environments. Positive and negative current-limiting is provided to protect the  
driver from line fault conditions over a + 12V to -7v common mode range. The DS96F174  
features separate active high Enables for each driver pair.  
Industry Part Number  
NS Part Numbers  
DS96F174  
DS96F174ME/883  
DS96F174MJ-QMLV  
DS96F174MJ/883  
DS96F174MW/883  
Prime Die  
DS96M174  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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