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DS26C31WG PDF预览

DS26C31WG

更新时间: 2024-02-10 23:35:38
品牌 Logo 应用领域
美国国家半导体 - NSC 驱动器
页数 文件大小 规格书
15页 340K
描述
CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER

DS26C31WG 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:DIP包装说明:DIP, DIP16,.3
针数:16Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:7.53差分输出:YES
驱动器位数:4高电平输入电流最大值:0.000001 A
输入特性:STANDARD接口集成电路类型:LINE DRIVER
接口标准:EIA-422JESD-30 代码:R-PDIP-T16
JESD-609代码:e3长度:19.05 mm
湿度敏感等级:1功能数量:4
端子数量:16最高工作温度:85 °C
最低工作温度:-40 °C输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:DIP
封装等效代码:DIP16,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT APPLICABLE
电源:5 V认证状态:Not Qualified
最大接收延迟:座面最大高度:4.318 mm
子类别:Line Driver or Receivers最大供电电压:5.5 V
最小供电电压:4.5 V标称供电电压:5 V
表面贴装:NO技术:CMOS
温度等级:INDUSTRIAL端子面层:Matte Tin (Sn)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
最大传输延迟:11 ns宽度:7.62 mm
Base Number Matches:1

DS26C31WG 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 01/23/96  
Last Update Date: 05/04/01  
MNDS26C31M-X REV 0B0  
Last Major Revision Date: 01/23/96  
CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER  
General Description  
The DS26C31 is a qual differential line driver designed for digital data transmission over  
balanced lines. The DS26C31 meets all the requirements of EIA standard RS-422 while  
retaining the low power characteristics of CMOS. This enables the construction of serial  
and terminal interfaces while maintaining minimal power consumption.  
The DS26C31 accepts TTL or CMOS input levels and translates these to RS-422 output levels.  
This part uses special output circuitry that enables the individual drivers to power down  
without loading down the bus. This device has enable and disable circuitry common to all  
four drivers. The DS26C31 is pin compatible to the AM26LS31 and the DS26LS31.  
All inputs are protected against damage due to electrostatic discharge by diodes to Vcc  
and ground.  
Industry Part Number  
NS Part Numbers  
DS26C31  
DS26C31ME/883  
DS26C31MJ/883  
DS26C31MW/883  
DS26C31MWG/883  
Prime Die  
DS26C31  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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