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DS10BR150 PDF预览

DS10BR150

更新时间: 2024-09-24 12:52:47
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
15页 793K
描述
DC - 1.0 Gbps Low Jitter, High Noise Immunity, Low Power Operation

DS10BR150 数据手册

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DS10BR150  
www.ti.com  
SNLS252D APRIL 2007REVISED APRIL 2013  
DS10BR150 1.0 Gbps LVDS Buffer / Repeater  
Check for Samples: DS10BR150  
1
FEATURES  
DESCRIPTION  
The DS10BR150 is a single channel 1.0 Gbps LVDS  
buffer optimized for high-speed signal transmission  
over lossy FR-4 printed circuit board backplanes and  
balanced cables. Fully differential signal paths ensure  
exceptional signal integrity and noise immunity.  
2
DC - 1.0 Gbps Low Jitter, High Noise  
Immunity, Low Power Operation  
On-chip 100Input and Output Termination  
Minimizes Insertion and Return Losses,  
Reduces Component Count and Minimizes  
Board Space  
Wide input common mode range allows the receiver  
to accept signals with LVDS, CML and LVPECL  
levels; the output levels are LVDS. A very small  
package footprint requires a minimal space on the  
board while the flow-through pinout allows easy board  
layout. The differential inputs and outputs are  
internally terminated with a 100resistor to lower  
device input and output return losses, reduce  
component count and further minimize board space.  
7 kV ESD on LVDS I/O Pins Protects Adjoining  
Components  
Small 3 mm x 3 mm 8-WSON Space Saving  
Package  
APPLICATIONS  
Clock and Data Buffering  
OC-12 / STM-4  
FireWire 800  
Typical Application  
CML  
LVDS  
ASIC / FPGA  
LVPECL  
ASIC / FPGA  
BR150  
LVDS  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2007–2013, Texas Instruments Incorporated  

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