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DN3765 PDF预览

DN3765

更新时间: 2024-11-14 03:30:11
品牌 Logo 应用领域
超科 - SUPERTEX /
页数 文件大小 规格书
3页 456K
描述
N-Channel Depletion-Mode Vertical DMOS FET

DN3765 数据手册

 浏览型号DN3765的Datasheet PDF文件第2页浏览型号DN3765的Datasheet PDF文件第3页 
DN3765  
N-Channel Depletion-Mode  
Vertical DMOS FET  
Features  
General Description  
This depletion-mode (normally-on) transistor utilizes an  
advanced vertical DMOS structure and Supertex’s well-  
provensilicon-gatemanufacturingprocess.Thiscombination  
produces a device with the power handling capabilities of  
bipolar transistors and with the high input impedance and  
positive temperature coefficient inherent in MOS devices.  
Characteristic of all MOS structures, this device is free  
from thermal runaway and thermally-induced secondary  
breakdown.  
High input impedance  
Low input capacitance  
Fast switching speeds  
Low on-resistance  
Free from secondary breakdown  
Low input and output leakage  
Applications  
Supertex’s vertical DMOS FETs are ideally suited to a  
wide range of switching and amplifying applications where  
high breakdown voltage, high input impedance, low input  
capacitance, and fast switching speeds are desired.  
Normally-on switches  
Solid state relays  
Converters  
Linear amplifiers  
Constant current sources  
Telecom  
Pin Configuration  
Ordering Information  
BVDSX  
/
RDS(ON)  
IDSS  
Package Option  
TO-252 (D-PAK)  
DN3765K4-G  
BVDGX  
(V)  
DRAIN  
max  
(Ω)  
min  
(mA)  
652  
8.2  
±22  
-G indicates package is RoHS compliant (‘Green’)  
SOURCE  
GATE  
TO-252 (D-PAK) (K4)  
Product Marking  
Absolute Maximum Ratings  
Parameter  
Drain-to-source voltage  
Value  
BVDSX  
YY = Year Sealed  
YYWW  
DN3765  
LLLLLLL  
WW = Week Sealed  
L = Lot Number  
Drain-to-gate voltage  
BVDGX  
= “Green” Packaging  
Gate-to-source voltage  
±±2V  
-55OC to +152OC  
152OC  
TO-252 (D-PAK) (K4)  
Operating and storage temperature  
Maximum junction temperature  
Absolute Maximum Ratings are those values beyond which damage to the device  
may occur. Functional operation under these conditions is not implied. Continuous  
operation of the device at the absolute rating level may affect device reliability. All  
voltages are referenced to device ground.  

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