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DM54LS154J/883 PDF预览

DM54LS154J/883

更新时间: 2024-01-06 21:38:34
品牌 Logo 应用领域
德州仪器 - TI 驱动输入元件输出元件逻辑集成电路
页数 文件大小 规格书
5页 14K
描述
LS SERIES, OTHER DECODER/DRIVER, INVERTED OUTPUT, CDIP24, CERAMIC, DIP-24

DM54LS154J/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP24,.6Reach Compliance Code:unknown
风险等级:5.88JESD-30 代码:R-XDIP-T24
JESD-609代码:e0逻辑集成电路类型:OTHER DECODER/DRIVER
最大I(ol):0.004 A功能数量:1
端子数量:24最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC
封装代码:DIP封装等效代码:DIP24,.6
封装形状:RECTANGULAR封装形式:IN-LINE
电源:5 V最大电源电流(ICC):14 mA
Prop。Delay @ Nom-Sup:36 ns认证状态:Not Qualified
筛选级别:MIL-STD-883 Class C子类别:Decoder/Drivers
标称供电电压 (Vsup):5 V表面贴装:NO
技术:TTL温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
Base Number Matches:1

DM54LS154J/883 数据手册

 浏览型号DM54LS154J/883的Datasheet PDF文件第2页浏览型号DM54LS154J/883的Datasheet PDF文件第3页浏览型号DM54LS154J/883的Datasheet PDF文件第4页浏览型号DM54LS154J/883的Datasheet PDF文件第5页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 04/13/98  
Last Update Date: 06/16/98  
MNDM54LS154-X REV 0A0  
Last Major Revision Date: 04/13/98  
4-LINE to 16-LINE  
DECODERS/DEMULTIPLEXERS  
General Description  
Each of these 4-line to 16-line decoders utilizes TTL circuitry to decode four binary -  
coded inputs into one of sixteen mutually exclusive outputs when both the strobe inputs,  
G1 and G2 are LOW. The demultiplexing function is performed by using the four input lines  
to address the output line, passing data from one of the strobe inputs with the other  
strobe input LOW. When either strobe input is HIGH, all outputs are HIGH. These  
demultiplexers are ideally suited for implementing high-performance memory decoders. All  
inputs are buffered and input clamping diodes are provided to minimize transmission- line  
effects and thereby simplify system design.  
Industry Part Number  
NS Part Numbers  
54LS154  
DM54LS154J/883  
Prime Die  
R154  
Controlling Document  
8301701JA  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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