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DF5A6.8F_07 PDF预览

DF5A6.8F_07

更新时间: 2024-09-23 03:29:19
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
3页 183K
描述
Product for Use Only as Protection against Electrostatic Discharge (ESD)

DF5A6.8F_07 数据手册

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DF5A6.8F  
TOSHIBA Diodes for Protecting against ESD  
DF5A6.8F  
Product for Use Only as Protection against Electrostatic  
Discharge (ESD)  
Unit: mm  
* This product is for protection against electrostatic discharge (ESD) only  
and is not intended for any other usage, including without limitation,  
the constant voltage diode application.  
z
The mounting of four devices on an ultra-compact package allows the  
number of parts and the mounting cost to be reduced.  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Power dissipation  
Symbol  
P
Rating  
Unit  
200  
125  
MW  
°C  
1.CATHODE 1  
2. ANODE  
Junction temperature  
T
j
3.CATHODE2  
4.CATHODE3  
5.CATHODE4  
Storage temperature range  
T
stg  
55~125  
°C  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
JEDEC  
JEITA  
TOSHIBA  
1-3H1A  
Weight: 0.014 g (typ.)  
Please design the appropriate reliability upon reviewing the  
Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and  
estimated failure rate, etc).  
Electrical Characteristics (Ta = 25°C)  
Characteristic  
Zener voltage  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
V
Z
I
I
I
= 5 mA  
= 5 mA  
= 0.5 mA  
6.4  
6.8  
10  
30  
7.2  
25  
V
Z
Z
Z
Z
Dynamic impedance  
Knee dynamic impedance  
Reverse current  
Z
Z
ZK  
I
V
V
= 5 V  
0.5  
μA  
R
R
R
Terminal capacitance  
(between Cathode and Anode)  
C
T
= 0, f = 1 MHz  
45  
pF  
Guaranteed Level of ESD Immunity  
Test Condition  
ESD Immunity Level  
IEC61000-4-2  
(Contact discharge)  
± 30kV  
Criterion: No damage to device elements  
1
2007-11-21  

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