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DF5A6.8CJE PDF预览

DF5A6.8CJE

更新时间: 2024-09-23 03:29:19
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
3页 167K
描述
Product for Use Only as Protection against Electrostatic Discharge (ESD)

DF5A6.8CJE 技术参数

是否Rohs认证: 符合生命周期:Active
零件包装代码:SOD包装说明:R-PDSO-F5
针数:5Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.10.00.50
风险等级:5.52配置:COMMON ANODE, 4 ELEMENTS
二极管元件材料:SILICON二极管类型:ZENER DIODE
最大动态阻抗:25 ΩJESD-30 代码:R-PDSO-F5
元件数量:4端子数量:5
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性:UNIDIRECTIONAL
最大功率耗散:0.1 W认证状态:Not Qualified
标称参考电压:6.8 V子类别:Voltage Reference Diodes
表面贴装:YES技术:ZENER
端子形式:FLAT端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED最大电压容差:5.88%
工作测试电流:5 mABase Number Matches:1

DF5A6.8CJE 数据手册

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DF5A6.8CJE  
TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type  
DF5A6.8CJE  
Product for Use Only as Protection against Electrostatic  
Discharge (ESD)  
Unit: mm  
* This product is for protection against electrostatic discharge (ESD) only  
and is not intended for any other usage, including without limitation,  
the constant voltage diode application.  
z The mounting of four devices on an ultra-compact package allows  
the number of parts and the mounting cost to be reduced.  
z Low Terminal capacitance (between Cathode and Anode)  
: CT =23pF (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
1.CATHODE 1  
2. ANODE  
Characteristic  
Power dissipation  
Symbol  
P
Rating  
Unit  
3.CATHODE2  
4.CATHODE3  
5.CATHODE4  
100  
150  
mW  
°C  
Junction temperature  
T
j
Storage temperature range  
T
55~150  
°C  
stg  
JEDEC  
JEITA  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
TOSHIBA  
1-2W1A  
Weight: 0.003 g (typ.)  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Electrical Characteristics (Ta = 25°C)  
Characteristic  
Zener voltage  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
V
Z
I
I
= 5 mA  
= 5 mA  
6.4  
6.8  
7.2  
25  
V
Ω
Z
Z
Z
Dynamic impedance  
Reverse current  
Z
I
V
V
= 5 V  
0.5  
μA  
R
R
R
Terminal capacitance  
(between Cathode and Anode)  
C
T
= 0 V, f = 1 MHz  
23  
pF  
Guaranteed Level of ESD Immunity  
Test Condition  
ESD Immunity Level  
IEC61000-4-2  
(Contact discharge)  
± 25 kV  
Criterion: No damage to device elements  
1
2007-11-01  

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