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DAC8881SRGERG4 PDF预览

DAC8881SRGERG4

更新时间： 2024-09-16 04:38:31
品牌 Logo 应用领域
德州仪器 - TI 转换器数模转换器
页数 文件大小 规格书
34页 1225K
描述
16-Bit, Single-Channel, Low-Noise, Voltage-Output DIGITAL-TO-ANALOG CONVERTER

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DAC8881SRGERG4 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：QFN
包装说明：4 X 4 MM, GREEN, PLASTIC, VQFN-24针数：24
Reach Compliance Code：unknown风险等级：5.78
Is Samacsys：N最大模拟输出电压：5.5 V
最小模拟输出电压：转换器类型：D/A CONVERTER
输入位码：BINARY, 2'S COMPLEMENT BINARY输入格式：SERIAL
JESD-30 代码：S-PQCC-N24JESD-609代码：e4
长度：4 mm最大线性误差 (EL)：0.0015%
湿度敏感等级：2位数：16
功能数量：1端子数量：24
最高工作温度：105 °C最低工作温度：-40 °C
封装主体材料：PLASTIC/EPOXY封装代码：HVQCCN
封装等效代码：LCC24,.16SQ,20封装形状：SQUARE
封装形式：CHIP CARRIER, HEAT SINK/SLUG, VERY THIN PROFILE峰值回流温度（摄氏度）：260
电源：3/5 V认证状态：Not Qualified
座面最大高度：1 mm标称安定时间 (tstl)：5 µs
子类别：Other Converters最大压摆率：1.5 mA
标称供电电压：3 V表面贴装：YES
温度等级：INDUSTRIAL端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：NO LEAD端子节距：0.5 mm
端子位置：QUAD处于峰值回流温度下的最长时间：NOT SPECIFIED
宽度：4 mmBase Number Matches：1

DAC8881SRGERG4 数据手册

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DAC8881  
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SBAS422A–JULY 2007–REVISED SEPTEMBER 2007  
16-Bit, Single-Channel, Low-Noise, Voltage-Output  
DIGITAL-TO-ANALOG CONVERTER  
1
FEATURES  
DESCRIPTION  
2345  
•
Relative Accuracy: ±0.5 LSB  
16-Bit Monotonic Over Temperature Range  
Low-Noise: 24nV/√Hz  
The DAC8881 is  
a
16-bit, single-channel,  
voltage-output digital-to-analog converter (DAC) that  
offers low-power operation and a flexible SPI serial  
interface. It also features 16-bit monotonicity,  
excellent linearity, and fast settling time. The on-chip  
precision output amplifier allows rail-to-rail output  
swing to be achieved over the full supply range of  
2.7V to 5.5V.  
•
•
•
•
Fast Settling: 5μs  
On-Chip Output Buffer Amplifier with  
Rail-to-Rail Operation  
•
•
•
Wide, Single Power Supply: +2.7V to +5.5V  
DAC Loading Control  
The device supports a standard SPI serial interface  
capable of operating with input data clock frequencies  
up to 50MHz. The DAC8881 requires an external  
reference voltage to set the output range of the DAC  
channel. A programmable power-on reset circuit is  
also incorporated into the device to ensure that the  
DAC output powers up at zero-scale or midscale, and  
remains there until a valid write command.  
Selectable Power-On Reset to Zero-Scale or  
Midscale  
•
•
Power-Down Mode  
Unipolar Straight Binary or  
2's Complement Input Mode  
•
•
Fast SPI™ Interface with Schmitt-Triggered  
Inputs:  
Up To 50MHz, 1.8V/3V/5V Logic  
Additionally, the device has the capability to function  
in either unipolar straight binary or 2's complement  
mode. The DAC8881 provides a power-down feature,  
accessed over the PDN pin, that reduces the current  
consumption to 25μA at 5V. Power consumption is  
6mW at 5V, reducing to 125μW in power-down mode.  
Small Package: QFN-24, 4x4mm  
APPLICATIONS  
•
•
•
•
•
Industrial Process Control  
Data Acquisition Systems  
Automatic Test Equipment  
Communications  
The DAC8881 is available in a 4x4mm QFN-24  
package with a specified operating temperature range  
of –40°C to +105°C.  
Optical Networking  
DVDD  
DGND  
IOVDD  
AGND  
AVDD  
VREFH-S VREFH-F  
DAC8881  
RST  
RSTSEL  
USB/BTC  
GAIN  
Power-On  
Reset  
Control  
Logic  
Resistor  
Network  
SDI  
CS  
PDN  
VOUT  
RFB  
SCLK  
Input  
Register  
DAC  
Latch  
DAC  
(1)  
RFB  
SDOSEL  
SDO  
Serial Out  
Control  
NOTE: (1) RFB = 5kW for gain = 1,  
RFB = 10kW for gain = 2.  
LDAC  
VREFL-S  
VREFL-F  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
3
4
5
DSP is a trademark of Texas Instruments.  
SPI, QSPI are trademarks of Motorola, Inc.  
MICROWIRE is a trademark of National Semiconductor.  
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2007, Texas Instruments Incorporated  
1234567...34

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