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DAC8814ICDBRG4 PDF预览

DAC8814ICDBRG4

更新时间: 2024-11-27 15:41:03
品牌 Logo 应用领域
德州仪器 - TI 输入元件光电二极管转换器
页数 文件大小 规格书
27页 3361K
描述
SERIAL INPUT LOADING, 0.5us SETTLING TIME, 16-BIT DAC, PDSO28, GREEN, PLASTIC, SSOP-28

DAC8814ICDBRG4 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:SSOP
包装说明:SSOP, SSOP28,.3针数:28
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.74
最大模拟输出电压:10 V最小模拟输出电压:-10 V
转换器类型:D/A CONVERTER输入位码:BINARY
输入格式:SERIALJESD-30 代码:R-PDSO-G28
JESD-609代码:e4长度:10.2 mm
最大线性误差 (EL):0.0015%湿度敏感等级:2
位数:16功能数量:1
端子数量:28最高工作温度:85 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:SSOP封装等效代码:SSOP28,.3
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, SHRINK PITCH
峰值回流温度(摄氏度):260电源:3/5 V
认证状态:Not Qualified座面最大高度:2 mm
标称安定时间 (tstl):0.5 µs子类别:Other Converters
最大压摆率:0.005 mA标称供电电压:5 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:5.3 mm
Base Number Matches:1

DAC8814ICDBRG4 数据手册

 浏览型号DAC8814ICDBRG4的Datasheet PDF文件第2页浏览型号DAC8814ICDBRG4的Datasheet PDF文件第3页浏览型号DAC8814ICDBRG4的Datasheet PDF文件第4页浏览型号DAC8814ICDBRG4的Datasheet PDF文件第5页浏览型号DAC8814ICDBRG4的Datasheet PDF文件第6页浏览型号DAC8814ICDBRG4的Datasheet PDF文件第7页 
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DAC8814  
SBAS338DJANUARY 2005REVISED SEPTEMBER 2006  
Quad, Serial Input 16-Bit Multiplying Digital-to-Analog Converter  
FEATURES  
DESCRIPTION  
Relative Accuracy: 1 LSB Max  
Differential Nonlinearity: 1 LSB Max  
2-mA Full-Scale Current  
with VREF = ±10 V  
0.5-µs Settling Time  
Midscale or Zero-Scale Reset  
Four Separate 4Q Multiplying Reference  
Inputs  
The DAC8814 is a quad, 16-bit, current-output  
digital-to-analog converter (DAC) designed to  
operate from a single +2.7-V to 5.0-V supply.  
The applied external reference input voltage VREF  
determines the full-scale output current. An internal  
feedback resistor (RFB  
)
provides temperature  
tracking for the full-scale output when combined with  
an external I-to-V precision amplifier.  
A doubled buffered serial data interface offers  
high-speed, 3-wire, SPI and microcontroller  
compatible inputs using serial data in (SDI), clock  
(CLK), and a chip-select (CS). In addition, a serial  
data out pin (SDO) allows for daisy-chaining when  
Reference Bandwidth: 10 MHz  
Reference Dynamics: –105 dB THD  
SPI™-Compatible 3-Wire Interface:  
50 MHz  
Double Buffered Registers Enable  
Simultaneous Multichannel Change  
Internal Power-On Reset  
multiple  
packages  
are  
used.  
A
common  
level-sensitive load DAC strobe (LDAC) input allows  
simultaneous update of all DAC outputs from  
previously loaded input registers. Additionally, an  
internal power-on reset forces the output voltage to  
zero at system turn on. An MSB pin allows system  
reset assertion (RS) to force all registers to zero  
code when MSB = 0, or to half-scale code when  
MSB = 1.  
Industry-Standard Pin Configuration  
APPLICATIONS  
Automatic Test Equipment  
Instrumentation  
Digitally-Controlled Calibration  
The DAC8814 is available in an SSOP package.  
A
B C D  
V
REF  
D0  
D1  
R A  
FB  
SDO  
D2  
D3  
D4  
D5  
D6  
D7  
D8  
D9  
D10  
D11  
D12  
D13  
D14  
D15  
A0  
Input  
Register  
DAC A  
Register  
DAC A  
DAC B  
DAC C  
DAC D  
I
A
OUT  
R
R
R
R
R
R
A
A
GND  
R
B
FB  
Input  
Register  
DAC B  
Register  
16  
I
C
OUT  
A
B
GND  
R
I
C
FB  
Input  
Register  
DAC C  
Register  
C
OUT  
SDI  
A1  
A
C
GND  
CLK  
R
D
FB  
EN  
CS  
Input  
Register  
DAC D  
Register  
I
D
OUT  
R
R
A
DAC  
B
C
D
A
D
GND  
2:4  
Power-On  
Reset  
A
F
GND  
Decode  
DGND  
RS  
MSB  
LDAC  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SPI is a trademark of Motorola, Inc.  
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2005–2006, Texas Instruments Incorporated  

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