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DAC8801IDRBR PDF预览

DAC8801IDRBR

更新时间: 2024-11-04 22:29:51
品牌 Logo 应用领域
BB 转换器光电二极管
页数 文件大小 规格书
16页 376K
描述
14-Bit, Serial Input Multiplying Digital-to-Analog Converter

DAC8801IDRBR 数据手册

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DAC8801  
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SLAS403ANOVEMBER 2004REVISED DECEMBER 2004  
14-Bit, Serial Input Multiplying Digital-to-Analog Converter  
FEATURES  
DESCRIPTION  
14-Bit Monotonic  
The DAC8801 multiplying digital-to-analog converter  
is designed to operate from a single 2.7-V to 5.5-V  
supply.  
±1 LSB INL  
±0.5 LSB DNL  
The applied external reference input voltage VREF  
determines the full-scale output current. An internal  
feedback resistor (RFB) provides temperature tracking  
for the full-scale output when combined with an  
external I-to-V precision amplifier.  
Low Noise: 12 nV/Hz  
Low Power: IDD = 2 µA  
+2.7 V to +5.5 V Analog Power Supply  
2 mA Full-Scale Current ±20%  
with VREF = 10 V  
A serial-data interface offers high-speed, three-wire  
microcontroller compatible inputs using data-in (SDI),  
clock (CLK), and chip select (CS).  
0.5 µs Settling Time  
4-Quadrant Multiplying Reference-Input  
Reference Bandwidth: 10 MHz  
±10 V Reference Input  
The DAC8801 is packaged in space-saving 8-lead  
SON and MSOP packages.  
Reference Dynamics: -105 THD  
3-Wire 50-MHz Serial Interface  
DAC8801  
R
FB  
V
DD  
Tiny 8-Lead 3 x 3 mm SON and 3 x 5 mm  
MSOP Packages  
D/A  
Converter  
I
V
REF  
OUT  
Industry-Standard Pin Configuration  
14  
DAC  
Register  
APPLICATIONS  
CS  
Automatic Test Equipment  
Instrumentation  
Digitally Controlled Calibration  
Industrial Control PLCs  
14  
Shift  
Register  
CLK  
SDI  
GND  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004, Texas Instruments Incorporated  

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