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CY7C1565V18-400BZXI PDF预览

CY7C1565V18-400BZXI

更新时间: 2024-11-19 05:09:39
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
28页 1218K
描述
72-Mbit QDR⑩-II+ SRAM 4-Word Burst Architecture (2.5 Cycle Read Latency)

CY7C1565V18-400BZXI 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:LBGA, BGA165,11X15,40针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.82
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):400 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:17 mm内存密度:75497472 bit
内存集成电路类型:QDR SRAM内存宽度:36
湿度敏感等级:3功能数量:1
端子数量:165字数:2097152 words
字数代码:2000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:2MX36输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.55 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:1.4 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:20宽度:15 mm

CY7C1565V18-400BZXI 数据手册

 浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第2页浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第3页浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第4页浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第5页浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第6页浏览型号CY7C1565V18-400BZXI的Datasheet PDF文件第7页 
CY7C1561V18  
CY7C1576V18  
CY7C1563V18  
CY7C1565V18  
72-Mbit QDR™-II+ SRAM 4-Word Burst  
Architecture (2.5 Cycle Read Latency)  
Features  
Configurations  
Separate independent read and write data ports  
Supports concurrent transactions  
With Read Cycle Latency of 2.5 cycles:  
CY7C1561V18 – 8M x 8  
CY7C1576V18 – 8M x 9  
CY7C1563V18 – 4M x 18  
CY7C1565V18 – 2M x 36  
300 MHz to 400 MHz clock for high bandwidth  
4-Word Burst for reducing address bus frequency  
Double Data Rate (DDR) interfaces on both Read and Write  
Ports (data transferred at 800 MHz) at 400 MHz  
Functional Description  
The CY7C1561V18, CY7C1576V18, CY7C1563V18, and  
CY7C1565V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR-II+ architecture. Similar to QDR-II archi-  
tecture, QDR-II+ SRAMs consists of two separate ports to  
access the memory array. The Read Port has dedicated data  
outputs to support read operations and the Write Port has  
dedicated data inputs to support write operations. QDR-II+ archi-  
tecture has separate data inputs and data outputs to completely  
eliminate the need to “turn-around” the data bus required with  
common IO devices. Access to each port is accomplished  
through a common address bus. Addresses for read and write  
addresses are latched on alternate rising edges of the input (K)  
clock. Accesses to the QDR-II+ Read and Write Ports are  
completely independent of one another. In order to maximize  
data throughput, both Read and Write Ports are equipped with  
Double Data Rate (DDR) interfaces. Each address location is  
associated with four 8-bit words (CY7C1561V18), 9-bit words  
(CY7C1576V18), 18-bit words (CY7C1563V18), or 36-bit words  
(CY7C1565V18) that burst sequentially into or out of the device.  
Since data can be transferred into and out of the device on every  
rising edge of both input clocks (K and K), memory bandwidth is  
maximized while simplifying system design by eliminating bus  
“turn-arounds”.  
Read latency of 2.5 clock cycles  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Echo clocks (CQ and CQ) simplify data capture in high speed  
systems  
Data valid pin (QVLD) to indicate valid data on the output  
Single multiplexed address input bus latches address inputs  
for both Read and Write Ports  
Separate port selects for depth expansion  
Synchronous internally self-timed writes  
Available in x8, x9, x18, and x36 configurations  
Full data coherency providing most current data  
[1]  
Core VDD = 1.8V ± 0.1V; IO VDDQ = 1.4V to VDD  
HSTL inputs and Variable drive HSTL output buffers  
Available in 165-ball FBGA package (15 x 17 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
JTAG 1149.1 compatible test access port  
Depth expansion is accomplished with port selects for each port.  
Port selects allow each port to operate independently.  
Delay Lock Loop (DLL) for accurate data placement  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
Selection Guide  
400 MHz  
400  
375 MHz  
375  
333 MHz  
333  
300 MHz  
300  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
x8  
x9  
1400  
1400  
1400  
1400  
1300  
1300  
1300  
1300  
1200  
1200  
1200  
1200  
1100  
1100  
x18  
x36  
1100  
1100  
Note  
1. The QDR consortium specification for V  
is 1.5V + 0.1V. The Cypress QDR devices exceed the QDR consortium specification and are capable of supporting  
DDQ  
V
= 1.4V to V  
.
DDQ  
DD  
Cypress Semiconductor Corporation  
Document Number: 001-05384 Rev. *E  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised July 24, 2007  

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