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CY7C1510V18-167BZC PDF预览

CY7C1510V18-167BZC

更新时间: 2024-11-24 05:19:43
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
24页 359K
描述
72-Mbit QDR-II⑩ SRAM 2-Word Burst Architecture

CY7C1510V18-167BZC 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.92
最长访问时间:0.5 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):167 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:17 mm内存密度:67108864 bit
内存集成电路类型:QDR SRAM内存宽度:8
湿度敏感等级:3功能数量:1
端子数量:165字数:8388608 words
字数代码:8000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:8MX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):220电源:1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最小待机电流:1.7 V子类别:SRAMs
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:15 mm
Base Number Matches:1

CY7C1510V18-167BZC 数据手册

 浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第2页浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第3页浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第4页浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第5页浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第6页浏览型号CY7C1510V18-167BZC的Datasheet PDF文件第7页 
CY7C1510V18  
CY7C1525V18  
CY7C1512V18  
CY7C1514V18  
PRELIMINARY  
72-Mbit QDR-II™ SRAM 2-Word Burst Architecture  
Features  
Functional Description  
• Separate Independent Read and Write Data Ports  
The CY7C1510V18, CY7C1525V18, CY7C1512V18, and  
CY7C1514V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR-II architecture. QDR-II architecture  
consists of two separate ports to access the memory array.  
The Read port has dedicated Data Outputs to support Read  
operations and the Write Port has dedicated Data Inputs to  
support Write operations. QDR-II architecture has separate  
data inputs and data outputs to completely eliminate the need  
to “turn-around” the data bus required with common I/O  
devices. Access to each port is accomplished through a  
common address bus. The Read address is latched on the  
rising edge of the K clock and the Write address is latched on  
— Supports concurrent transactions  
• 200-MHz clock for high bandwidth  
• 2-Word Burst on all accesses  
• Double Data Rate (DDR) interfaces on both Read and  
Write ports (data transferred at 400 MHz) @ 200 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two output clocks (C and C) accounts for clock skew  
and flight time mismatching  
the rising edge of the clock. Accesses to the QDR-II Read  
K
• Echo clocks (CQ and CQ) simplify data capture in high  
speed systems  
and Write ports are completely independent of one another. In  
order to maximize data throughput, both Read and Write ports  
are equipped with Double Data Rate (DDR) interfaces. Each  
address location is associated with two 8-bit words  
(CY7C1510V18) or 9-bit words (CY7C1525V18) or 18-bit  
words (CY7C1512V18) or 36-bit words (CY7C1514V18) that  
burst sequentially into or out of the device. Since data can be  
transferred into and out of the device on every rising edge of  
both input clocks (K and K and C and C), memory bandwidth  
is maximized while simplifying system design by eliminating  
bus “turn-arounds.”  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in x8, x9, x18, and x36 configurations  
• Full data coherency, providing most current data  
• Core VDD = 1.8V(±0.1V);I/O VDDQ = 1.4V to VDD  
• 15 × 17 × 1.4 mm 1.0-mm pitch FBGA package, 165-ball  
(11 × 15 matrix)  
Depth expansion is accomplished with Port Selects for each  
port. Port selects allow each port to operate independently.  
• Variable drive HSTL output buffers  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
• JTAG 1149.1 compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1510V18 – 8M x 8  
CY7C1525V18 – 8M x 9  
CY7C1512V18 – 4M x 18  
CY7C1514V18 – 2M x 36  
Cypress Semiconductor Corporation  
Document #: 38-05489 Rev. *A  
3901 North First Street  
San Jose, CA 95134  
408-943-2600  
Revised July 21, 2004  

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