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CY7C1512V18-167BZI PDF预览

CY7C1512V18-167BZI

更新时间: 2024-01-16 22:27:37
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
27页 489K
描述
72-Mbit QDR-II⑩ SRAM 2-Word Burst Architecture

CY7C1512V18-167BZI 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165
针数:165Reach Compliance Code:not_compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.83最长访问时间:0.5 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):167 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:17 mm
内存密度:75497472 bit内存集成电路类型:QDR SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:165
字数:4194304 words字数代码:4000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:4MX18
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):220
电源:1.8 V认证状态:Not Qualified
座面最大高度:1.4 mm最小待机电流:1.7 V
子类别:SRAMs最大供电电压 (Vsup):1.9 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

CY7C1512V18-167BZI 数据手册

 浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第2页浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第3页浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第4页浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第5页浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第6页浏览型号CY7C1512V18-167BZI的Datasheet PDF文件第7页 
CY7C1510V18  
CY7C1525V18  
CY7C1512V18  
CY7C1514V18  
72-Mbit QDR-II™ SRAM 2-Word Burst  
Architecture  
Features  
Functional Description  
• Separate Independent Read and Write Data Ports  
— Supports concurrent transactions  
• 250-MHz clock for high bandwidth  
• 2-Word Burst on all accesses  
The CY7C1510V18, CY7C1525V18, CY7C1512V18, and  
CY7C1514V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR-II architecture. QDR-II architecture  
consists of two separate ports to access the memory array.  
The Read port has dedicated Data Outputs to support Read  
operations and the Write Port has dedicated Data Inputs to  
support Write operations. QDR-II architecture has separate  
data inputs and data outputs to completely eliminate the need  
to “turn-around” the data bus required with common I/O  
devices. Access to each port is accomplished through a  
common address bus. The Read address is latched on the  
rising edge of the K clock and the Write address is latched on  
• Double Data Rate (DDR) interfaces on both Read and  
Write ports (data transferred at 500 MHz) @ 250 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize  
clock-skew and flight-time mismatches  
the rising edge of the clock. Accesses to the QDR-II Read  
K
and Write ports are completely independent of one another. In  
order to maximize data throughput, both Read and Write ports  
are equipped with Double Data Rate (DDR) interfaces. Each  
address location is associated with two 8-bit words  
(CY7C1510V18) or 9-bit words (CY7C1525V18) or 18-bit  
words (CY7C1512V18) or 36-bit words (CY7C1514V18) that  
burst sequentially into or out of the device. Since data can be  
transferred into and out of the device on every rising edge of  
both input clocks (K and K and C and C), memory bandwidth  
is maximized while simplifying system design by eliminating  
bus “turn-arounds.”  
• Echo clocks (CQ and CQ) simplify data capture in high  
speed systems  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in x8, x9, x18, and x36 configurations  
• Full data coherency, providing most current data  
• Core VDD = 1.8V (±0.1V); I/O VDDQ = 1.4V to VDD  
• Available in 165-ball FBGA package (15 x 17 x 1.4 mm)  
• Offered in lead-free and non-lead free packages  
• Variable drive HSTL output buffers  
Depth expansion is accomplished with Port Selects for each  
port. Port selects allow each port to operate independently.  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
• JTAG 1149.1 compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1510V18 – 8M x 8  
CY7C1525V18 – 8M x 9  
CY7C1512V18 – 4M x 18  
CY7C1514V18 – 2M x 36  
Selection Guide  
250 MHz  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
250  
950  
850  
800  
Cypress Semiconductor Corporation  
Document #: 38-05489 Rev. *D  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised May 31, 2006  
[+] Feedback  

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