Datasheet > 存储 > SRAM> CY7C1511V18-300BZC

CY7C1511V18-300BZC

更新时间： 2024-11-27 05:19:47

品牌	Logo	应用领域
赛普拉斯 - CYPRESS		静态存储器
页数	文件大小	规格书
28页	460K
描述
72-Mbit QDR⑩- II SRAM 4-Word Burst Architecture

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CY7C1511V18-300BZC 技术参数

是否无铅：	含铅	是否Rohs认证：	不符合
生命周期：	Obsolete	零件包装代码：	BGA
包装说明：	15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165	针数：	165
Reach Compliance Code：	compliant	ECCN代码：	3A991.B.2.A
HTS代码：	8542.32.00.41	风险等级：	5.45
最长访问时间：	0.45 ns	其他特性：	PIPELINED ARCHITECTURE
最大时钟频率 (fCLK)：	300 MHz	I/O 类型：	SEPARATE
JESD-30 代码：	R-PBGA-B165	JESD-609代码：	e0
长度：	17 mm	内存密度：	67108864 bit
内存集成电路类型：	QDR SRAM	内存宽度：	8
湿度敏感等级：	3	功能数量：	1
端子数量：	165	字数：	8388608 words
字数代码：	8000000	工作模式：	SYNCHRONOUS
最高工作温度：	70 °C	最低工作温度：
组织：	8MX8	输出特性：	3-STATE
封装主体材料：	PLASTIC/EPOXY	封装代码：	LBGA
封装等效代码：	BGA165,11X15,40	封装形状：	RECTANGULAR
封装形式：	GRID ARRAY, LOW PROFILE	并行/串行：	PARALLEL
峰值回流温度（摄氏度）：	220	电源：	1.5/1.8,1.8 V
认证状态：	Not Qualified	座面最大高度：	1.4 mm
最小待机电流：	1.7 V	子类别：	SRAMs
最大压摆率：	0.95 mA	最大供电电压 (Vsup)：	1.9 V
最小供电电压 (Vsup)：	1.7 V	标称供电电压 (Vsup)：	1.8 V
表面贴装：	YES	技术：	CMOS
温度等级：	COMMERCIAL	端子面层：	Tin/Lead (Sn/Pb)
端子形式：	BALL	端子节距：	1 mm
端子位置：	BOTTOM	处于峰值回流温度下的最长时间：	NOT SPECIFIED
宽度：	15 mm	Base Number Matches：	1

CY7C1511V18-300BZC 数据手册

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CY7C1511V18

CY7C1526V18

CY7C1513V18

CY7C1515V18

72-Mbit QDR™- II SRAM 4-Word Burst

Architecture

Features

Functional Description

• Separate Independent Read and Write Data Ports

— Supports concurrent transactions

The CY7C1511V18, CY7C1526V18, CY7C1513V18, and

CY7C1515V18 are 1.8V Synchronous Pipelined SRAMs,

equipped with QDR-II architecture. QDR-II architecture

consists of two separate ports to access the memory array.

The Read port has dedicated Data Outputs to support Read

operations and the Write Port has dedicated Data Inputs to

support Write operations. QDR-II architecture has separate

data inputs and data outputs to completely eliminate the need

to “turn-around” the data bus required with common I/O

devices. Access to each port is accomplished through a

common address bus. Addresses for Read and Write

addresses are latched on alternate rising edges of the input

(K) clock. Accesses to the QDR-II Read and Write ports are

completely independent of one another. In order to maximize

data throughput, both Read and Write ports are equipped with

Double Data Rate (DDR) interfaces. Each address location is

associated with four 8-bit words (CY7C1511V18) or 9-bit

words (CY7C1526V18) or 18-bit words (CY7C1513V18) or

36-bit words (CY7C1515V18) that burst sequentially into or

out of the device. Since data can be transferred into and out

of the device on every rising edge of both input clocks (K and

K and C and C), memory bandwidth is maximized while simpli-

fying system design by eliminating bus “turn-arounds”.

• 300-MHz Clock for High Bandwidth

• 4-Word Burst for reducing address bus frequency

• Double Data Rate (DDR) interfaces on both Read and

Write Ports (data transferred at 600 MHz) at 300 MHz

• Two input clocks (K and K) for precise DDR timing

— SRAM uses rising edges only

• Two input clocks for output data (C and C) to minimize

clock-skew and flight-time mismatches

• Echo clocks (CQ and CQ) simplify data capture in high

speed systems

• Single multiplexed address input bus latches address

inputs for both Read and Write ports

• Separate Port Selects for depth expansion

• Synchronous internally self-timed writes

• Available in x8, x9, x18, and x36 configurations

• Full data coherency providing most current data

• Core V_DD= 1.8 (±0.1V); I/O V_DDQ= 1.4V to V_DD

• Available in 165-ball FBGA package (15 x 17 x 1.4 mm)

• Offered in both lead-free and non-lead free packages

• Variable drive HSTL output buffers

Depth expansion is accomplished with Port Selects for each

port. Port selects allow each port to operate independently.

All synchronous inputs pass through input registers controlled

by the K or K input clocks. All data outputs pass through output

registers controlled by the C or C (or K or K in a single clock

domain) input clocks. Writes are conducted with on-chip

synchronous self-timed write circuitry.

• JTAG 1149.1 Compatible test access port

• Delay Lock Loop (DLL) for accurate data placement

Configurations

CY7C1511V18 – 8M x 8

CY7C1526V18 – 8M x 9

CY7C1513V18 – 4M x 18

CY7C1515V18 – 2M x 36

Selection Guide

300 MHz

300

278 MHz

250 MHz

250

200 MHz

200

167 MHz

167

Unit

MHz

Maximum Operating Frequency

Maximum Operating Current

278

900

950

850

750

700

Cypress Semiconductor Corporation

Document #: 38-05363 Rev. *D

•

198 Champion Court

•

San Jose, CA 95134-1709

•

408-943-2600

Revised May 31, 2006

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与CY7C1511V18-300BZC相关器件

型号	品牌	获取价格	描述	数据表
CY7C1511V18-300BZI	CYPRESS	获取价格	72-Mbit QDR⑩- II SRAM 4-Word Burst Architectu
CY7C1511V18-300BZXC	CYPRESS	获取价格	72-Mbit QDR⑩- II SRAM 4-Word Burst Architectu
CY7C1511V18-300BZXI	CYPRESS	获取价格	72-Mbit QDR⑩- II SRAM 4-Word Burst Architectu
CY7C1512	CYPRESS	获取价格	64K x 8 Static RAM
CY7C1512-15SC	CYPRESS	获取价格	64K x 8 Static RAM
CY7C1512-15VC	ETC	获取价格	x8 SRAM
CY7C1512-15ZC	CYPRESS	获取价格	64K x 8 Static RAM
CY7C1512-20SC	CYPRESS	获取价格	64K x 8 Static RAM
CY7C1512-20VC	ETC	获取价格	x8 SRAM
CY7C1512-20ZC	CYPRESS	获取价格	64K x 8 Static RAM

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