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CY7C1511AV18-300BZI PDF预览

CY7C1511AV18-300BZI

更新时间: 2024-02-20 16:11:06
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器时钟
页数 文件大小 规格书
31页 709K
描述
72-Mbit QDR⑩-II SRAM 4-Word Burst Architecture

CY7C1511AV18-300BZI 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:BGA包装说明:LBGA, BGA165,11X15,40
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.45最长访问时间:0.45 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):300 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
JESD-609代码:e1长度:17 mm
内存密度:67108864 bit内存集成电路类型:QDR SRAM
内存宽度:8湿度敏感等级:3
功能数量:1端子数量:165
字数:8388608 words字数代码:8000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:8MX8
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):260
电源:1.5/1.8,1.8 V认证状态:Not Qualified
座面最大高度:1.4 mm最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.93 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:40宽度:15 mm
Base Number Matches:1

CY7C1511AV18-300BZI 数据手册

 浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第2页浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第3页浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第4页浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第5页浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第6页浏览型号CY7C1511AV18-300BZI的Datasheet PDF文件第7页 
CY7C1511AV18, CY7C1526AV18  
CY7C1513AV18, CY7C1515AV18  
72-Mbit QDR™-II SRAM 4-Word  
Burst Architecture  
Features  
Configurations  
Separate independent read and write data ports  
Supports concurrent transactions  
CY7C1511AV18 – 8M x 8  
CY7C1526AV18 – 8M x 9  
CY7C1513AV18 – 4M x 18  
CY7C1515AV18 – 2M x 36  
300 MHz clock for high bandwidth  
4-word burst for reducing address bus frequency  
Functional Description  
DoubleDataRate(DDR)interfacesonbothreadandwriteports  
(data transferred at 600 MHz) at 300 MHz  
The CY7C1511AV18, CY7C1526AV18, CY7C1513AV18, and  
CY7C1515AV18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR™-II architecture. QDR-II architecture  
consists of two separate ports: the read port and the write port to  
access the memory array. The read port has dedicated data  
outputs to support read operations and the write port has  
dedicated data inputs to support write operations. QDR-II archi-  
tecture has separate data inputs and data outputs to completely  
eliminate the need to “turn-around” the data bus that exists with  
common IO devices. Each port can be accessed through a  
common address bus. Addresses for read and write addresses  
are latched on alternate rising edges of the input (K) clock.  
Accesses to the QDR-II read and write ports are completely  
independent of one another. To maximize data throughput, both  
read and write ports are equipped with DDR interfaces. Each  
address location is associated with four 8-bit words  
(CY7C1511AV18), 9-bit words (CY7C1526AV18), 18-bit words  
(CY7C1513AV18), or 36-bit words (CY7C1515AV18) that burst  
sequentially into or out of the device. Because data can be trans-  
ferred into and out of the device on every rising edge of both input  
clocks (K and K and C and C), memory bandwidth is maximized  
while simplifying system design by eliminating bus  
“turn-arounds”.  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Two input clocks for output data (C and C) to minimize clock  
skew and flight time mismatches  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Single multiplexed address input bus latches address inputs  
for read and write ports  
Separate port selects for depth expansion  
Synchronous internally self-timed writes  
QDR-II operates with 1.5 cycle read latency when the Delay  
Lock Loop (DLL) is enabled  
Operates as a QDR-I device with 1 cycle read latency in DLL  
off mode  
Available in x 8, x 9, x 18, and x 36 configurations  
Full data coherency, providing most current data  
Core VDD = 1.8 (± 0.1V); IO VDDQ = 1.4V to VDD  
Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
Variable drive HSTL output buffers  
Depth expansion is accomplished with port selects, which  
enables each port to operate independently.  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
JTAG 1149.1 compatible test access port  
Delay Lock Loop (DLL) for accurate data placement  
Selection Guide  
Description  
300 MHz  
300  
278 MHz  
278  
250 MHz  
250  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
x8  
x9  
930  
865  
790  
655  
570  
940  
870  
795  
660  
575  
x18  
x36  
1020  
1230  
950  
865  
715  
615  
1140  
1040  
850  
725  
Cypress Semiconductor Corporation  
Document Number: 001-06985 Rev. *C  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised September 27, 2007  
[+] Feedback  

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