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CY7C1462V33-167BZC PDF预览

CY7C1462V33-167BZC

更新时间: 2024-02-25 05:59:18
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 时钟静态存储器内存集成电路
页数 文件大小 规格书
26页 478K
描述
ZBT SRAM, 2MX18, 3.5ns, CMOS, PBGA165, 15 X 17 MM, 1.20 MM HEIGHT, FBGA-165

CY7C1462V33-167BZC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:15 X 17 MM, 1.20 MM HEIGHT, FBGA-165
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.92最长访问时间:3.5 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):167 MHz
I/O 类型:COMMONJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:17 mm
内存密度:37748736 bit内存集成电路类型:ZBT SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:165
字数:2097152 words字数代码:2000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:2MX18
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, THIN PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):220
电源:2.5/3.3,3.3 V认证状态:Not Qualified
座面最大高度:1.2 mm最小待机电流:3.14 V
子类别:SRAMs最大供电电压 (Vsup):3.465 V
最小供电电压 (Vsup):3.135 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

CY7C1462V33-167BZC 数据手册

 浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第2页浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第3页浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第4页浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第5页浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第6页浏览型号CY7C1462V33-167BZC的Datasheet PDF文件第7页 
CY7C1460V33  
CY7C1462V33  
CY7C1464V33  
PRELIMINARY  
1M x 36/2M x 18/512K x 72 Pipelined SRAM  
with NoBL™ Architecture  
Clock Enable (CEN), Byte Write Selects (BWSa, BWSb, BWSc  
,BWSd, BWSe, BWSf, BWSg ,BWSh), and read-write control  
(WE). BWSc and BWSd apply to CY7C1460V33 and  
CY7C1464V33 only. BWSe, BWSf, BWSg, and BWSh apply to  
CY7C1464V33 only.  
Features  
• Zero Bus Latency , no dead cycles between write and  
read cycles  
• Fast clock speed: 250, 200, and 167 MHz  
• Fast access time: 2.7, 3.0 and 3.5 ns  
• Internally synchronized registered outputs eliminate  
the need to control OE  
• Single 3.3V –5% and +5% power supply VDD  
• Separate VDDQ for 3.3V or 2.5V  
• Single WE (Read/Write) control pin  
• Positive clock-edge triggered, address, data, and  
control signal registers for fully pipelined applications  
• Interleaved or linear four-word burst capability  
• Individual byte write (BWSa – BWSh) control (may be  
tied LOW)  
• CEN pin to enable clock and suspend operations  
• Three chip enables for simple depth expansion  
• JTAG boundary scan for BGA packaging version  
• Available in 119-ball bump BGA, 165-ball FBGA  
package and 100-pin TQFP packages (CY7C1460 and  
CY7C1462). 209 FBGA package for CY7C1464.  
Address and control signals are applied to the SRAM during  
one clock cycle, and two cycles later, its associated data  
occurs, either read or write.  
A
Clock Enable (CEN) pin allows operation of the  
CY7C1460V33, CY7C1462V33, and CY7C1464V33 to be  
suspended as long as necessary. All synchronous inputs are  
ignored when (CEN) is high and the internal device registers  
will hold their previous values.  
There are three Chip Enable (CE1, CE2, CE3) pins that allow  
the user to deselect the device when desired. If any one of  
these three are not active when ADV/LD is low, no new  
memory operation can be initiated and any burst cycle in  
progress is stopped. However, any pending data transfers  
(read or write) will be completed. The data bus will be in high  
impedance state two cycles after chip is deselected or a write  
cycle is initiated.  
The CY7C1460V33, CY7C1462V33, and CY7C1464V33  
have an on-chip two-bit burst counter. In the burst mode,  
CY7C1460V33, CY7C1462V33, and CY7C1464V33 provide  
four cycles of data for a single address presented to the  
SRAM. The order of the burst sequence is defined by the  
MODE input pin. The MODE pin selects between linear and  
interleaved burst sequence. The ADV/LD signal is used to load  
a new external address (ADV/LD = LOW) or increment the  
internal burst counter (ADV/LD = HIGH).  
Functional Description  
The CY7C1460V33, CY7C1462V33, and CY7C1464V33  
SRAMs are designed to eliminate dead cycles when transi-  
tions from READ to WRITE or vice versa. These SRAMs are  
optimized for 100 percent bus utilization and achieves Zero  
Bus Latency. They integrate 1,048,576 x 36/2,097,152 x 18/  
524,288 x 72 SRAM cells, respectively, with advanced  
synchronous peripheral circuitry and a two-bit counter for  
internal burst operation. The Synchronous Burst SRAM family  
employs high-speed, low-power CMOS designs using  
advanced single-layer polysilicon, three-layer metal  
technology. Each memory cell consists of six transistors.  
Output Enable (OE) and burst sequence select (MODE) are  
the asynchronous signals. OE can be used to disable the  
outputs at any given time. ZZ may be tied to LOW if it is not  
used.  
Four pins are used to implement JTAG test capabilities. The  
JTAG circuitry is used to serially shift data to and from the  
device. JTAG inputs use LVTTL/LVCMOS levels to shift data  
during this testing mode of operation.  
All synchronous inputs are gated by registers controlled by a  
positive-edge-triggered Clock Input (CLK). The synchronous  
inputs include all addresses, all data inputs, depth-expansion  
Chip Enables (CE1, CE2, and CE3), cycle start input (ADV/LD),  
D
CLK  
Data-In REG.  
Logic Block Diagram  
CE  
Q
ADV/LD  
A
x
CEN  
CE  
CONTROL  
and WRITE  
LOGIC  
1Mx36  
1
2Mx18  
CE  
CE  
DQ  
A
BWS  
X
DP  
X
2
X
X
512Kx72  
DQ  
DP  
x
3
WE  
X = a, b  
, c, d  
X = a, b, X= a, b,  
c, d  
MEMORY  
ARRAY  
X = 19:0  
X = 20:0  
x
1Mx36  
c, d  
BWS  
x
X = a, b  
X = a, b X = a, b  
Mode  
2Mx18  
X = a, b  
X = a, b,  
X = a, b,  
X = 18:0  
512Kx72  
c,d,e,f,g,h  
c,d,e,f,g,h  
c,d,e,f,g,h  
OE  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose  
CA 95134  
408-943-2600  
Document #: 38-05190 Rev. *C  
Revised November 14, 2002  

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