CY7C1354CV25
CY7C1356CV25
PRELIMINARY
9-Mbit (256K x 36/512K x 18) Pipelined SRAM
with NoBL™ Architecture
Features
Functional Description
• Pin-compatible with and functionally equivalent to
ZBT™
The CY7C1354CV25 and CY7C1356CV25 are 2.5V, 256K x
36 and 512K x 18 Synchronous pipelined burst SRAMs with
No Bus Latency™ (NoBL™) logic, respectively. They are
designed to support unlimited true back-to-back Read/Write
operations with no wait states. The CY7C1354CV25 and
CY7C1356CV25 are equipped with the advanced (NoBL) logic
required to enable consecutive Read/Write operations with
data being transferred on every clock cycle. This feature
dramatically improves the throughput of data in systems that
require frequent Write/Read transitions. The CY7C1354CV25
and CY7C1356CV25 are pin-compatible with and functionally
equivalent to ZBT devices.
• Supports 225-MHz bus operations with zero wait states
— Available speed grades are 225, 200, and 167 MHz
• Internally self-timed output buffer control to eliminate
the need to use asynchronous OE
• Fully registered (inputs and outputs) for pipelined
operation
• Byte Write capability
• Single 2.5V power supply
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. All data outputs pass through
output registers controlled by the rising edge of the clock. The
clock input is qualified by the Clock Enable (CEN) signal,
which when deasserted suspends operation and extends the
previous clock cycle.
• Fast clock-to-output times
— 2.8 ns (for 225-MHz device)
— 3.2ns (for 200-MHz device)
— 3.5 ns (for 167-MHz device)
• Clock Enable (CEN) pin to suspend operation
• Synchronous self-timed writes
Write operations are controlled by the Byte Write Selects
(BWa–BWd for CY7C1354CV25 and BWa–BWb for
CY7C1356CV25) and a Write Enable (WE) input. All writes are
conducted with on-chip synchronous self-timed write circuitry.
• Available in lead-free 100 TQFP, 119 BGA, and 165 fBGA
packages
Three synchronous Chip Enables (CE1, CE2, CE3) and an
asynchronous Output Enable (OE) provide for easy bank
selection and output three-state control. In order to avoid bus
contention, the output drivers are synchronously three-stated
during the data portion of a write sequence.
• IEEE 1149.1 JTAG Boundary Scan
• Burst capability–linear or interleaved burst order
• “ZZ” Sleep Mode option and Stop Clock option
Logic Block Diagram–CY7C1354CV25 (256K x 36)
ADDRESS
REGISTER 0
A0, A1, A
A1
A0
A1'
A0'
D1
D0
Q1
Q0
BURST
LOGIC
MODE
C
ADV/LD
C
CLK
CEN
WRITE ADDRESS
REGISTER 1
WRITE ADDRESS
REGISTER 2
O
O
S
U
D
A
T
U
T
P
T
P
E
N
S
U
T
U
T
ADV/LD
A
E
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
R
E
G
I
MEMORY
ARRAY
B
U
F
S
T
E
E
R
I
DQs
DQP
DQP
DQP
DQP
WRITE
DRIVERS
BW
BW
a
a
b
c
d
A
M
P
b
BW
BW
c
S
T
E
R
S
F
d
E
R
S
S
WE
E
E
N
G
INPUT
REGISTER 1
INPUT
REGISTER 0
E
E
OE
READ LOGIC
CE1
CE2
CE3
SLEEP
CONTROL
ZZ
Cypress Semiconductor Corporation
Document #: 38-05537 Rev. *B
•
3901 North First Street
•
San Jose, CA 95134
•
408-943-2600
Revised November 1, 2004