CY7C1351G
PRELIMINARY
4-Mbit (128K x 36) Flow-through SRAM
with NoBL™ Architecture
Functional Description[1]
Features
• Can support up to 133-MHz bus operations with zero
wait states
The CY7C1351G is a 3.3V, 128K x 36 Synchronous
Flow-through Burst SRAM designed specifically to support
unlimited true back-to-back Read/Write operations without the
insertion of wait states. The CY7C1351G is equipped with the
advanced No Bus Latency™ (NoBL™) logic required to
enable consecutive Read/Write operations with data being
transferred on every clock cycle. This feature dramatically
improves the throughput of data through the SRAM, especially
in systems that require frequent Write-Read transitions.
— Data is transferred on every clock
• Pin compatible and functionally equivalent to ZBT™
devices
• Internally self-timed output buffer control to eliminate
the need to use OE
• Registered inputs for flow-through operation
• Byte Write capability
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. The clock input is qualified by
the Clock Enable (CEN) signal, which when deasserted
suspends operation and extends the previous clock cycle.
Maximum access delay from the clock rise is 6.5 ns (133-MHz
device).
• 128K x 36 common I/O architecture
• 2.5V / 3.3V I/O power supply
• Fast clock-to-output times
— 6.5 ns (for 133-MHz device)
Write operations are controlled by the four Byte Write Select
(BW[A:D]) and a Write Enable (WE) input. All writes are
conducted with on-chip synchronous self-timed write circuitry.
— 7.5 ns (for 117-MHz device)
— 8.0 ns (for 100-MHz device)
Three synchronous Chip Enables (CE1, CE2, CE3) and an
asynchronous Output Enable (OE) provide for easy bank
selection and output tri-state control. In order to avoid bus
contention, the output drivers are synchronously tri-stated
during the data portion of a write sequence.
• Clock Enable (CEN) pin to suspend operation
• Synchronous self-timed writes
• Asynchronous Output Enable
• Lead-Free 100 TQFP and 119 BGA packages
• Burst Capability—linear or interleaved burst order
• Low standby power
Logic Block Diagram
ADDRESS
A0, A1, A
REGISTER
A1
A1'
Q1
D1
A0
A0'
Q0
D0
MODE
C
BURST
LOGIC
CE
ADV/LD
C
CLK
CEN
WRITE ADDRESS
REGISTER
O
U
T
P
U
T
D
A
T
S
E
N
S
ADV/LD
A
B
U
F
MEMORY
ARRAY
BWA
BWB
BWC
BWD
WRITE
DRIVERS
E
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
S
T
E
E
R
I
DQs
DQP
DQP
DQP
DQP
A
B
C
D
A
M
P
F
E
R
S
S
WE
E
N
G
INPUT
REGISTER
E
OE
READ LOGIC
CE1
CE2
CE3
SLEEP
Control
ZZ
Note:
1. For best–practices recommendations, please refer to the Cypress application note System Design Guidelines on www.cypress.com.
Cypress Semiconductor Corporation
Document #: 38-05513 Rev. *A
•
3901 North First Street
•
San Jose, CA 95134
•
408-943-2600
Revised October 14, 2004