CY7C1319KV18/CY7C1321KV18
18-Mbit DDR II SRAM
Four-Word Burst Architecture
18-Mbit DDR II SRAM Four-Word Burst Architecture
Features
Configurations
■ 18-Mbit density (1M × 18, 512K × 36)
■ 333-MHz clock for high bandwidth
CY7C1319KV18 – 1M × 18
CY7C1321KV18 – 512K × 36
■ Four-word burst for reducing address bus frequency
Functional Description
■ Double data rate (DDR) interfaces (data transferred at
666 MHz) at 333 MHz
CY7C1319KV18 and CY7C1321KV18 are 1.8 V Synchronous
Pipelined SRAMs equipped with DDR II architecture. The DDR
II consists of an SRAM core with advanced synchronous
peripheral circuitry and a two-bit burst counter. Addresses for
read and write are latched on alternate rising edges of the input
(K) clock. Write data is registered on the rising edges of both K
and K. Read data is driven on the rising edges of C and C if
provided, or on the rising edge of K and K if C/C are not provided.
For CY7C1319KV18 and CY7C1321KV18, the burst counter
takes in the least two significant bits of the external address and
bursts four 18-bit words in the case of CY7C1319KV18, and four
36-bit words in the case of CY7C1321KV18, sequentially into or
out of the device.
■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■ Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
■ Echo clocks (CQ and CQ) simplify data capture in high speed
systems
■ Synchronous internally self-timed writes
■ DDR II operates with 1.5 cycle read latency when DOFF is
asserted HIGH
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs, D) are tightly matched to the two
output echo clocks CQ/CQ, eliminating the need to capture data
separately from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
■ Operates similar to DDR I device with one cycle read latency
when DOFF is asserted LOW
■ 1.8 V core power supply with HSTL inputs and outputs
■ Variable drive HSTL output buffers
■ Expanded HSTL output voltage (1.4 V–VDD
)
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
❐ Supports both 1.5 V and 1.8 V I/O supply
■ Available in 165-ball FBGA package (13 × 15 ×1.4 mm)
■ Offered in both Pb-free and non Pb-free packages
■ JTAG 1149.1 compatible test access port
For a complete list of related documentation, click here.
■ Phase locked loop (PLL) for accurate data placement
Selection Guide
Description
Maximum operating frequency
333 MHz
300
250 MHz Unit
250
320
370
MHz
mA
Maximum operating current
× 18
× 36
370
440
Cypress Semiconductor Corporation
Document Number: 001-58906 Rev. *K
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised December 19, 2017