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CY7C11681KV18-450BZXC PDF预览

CY7C11681KV18-450BZXC

更新时间: 2024-11-07 09:43:39
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器双倍数据速率时钟
页数 文件大小 规格书
26页 749K
描述
18-Mbit DDR II+ SRAM Two-Word Burst Architecture (2.5 Cycle Read Latency)

CY7C11681KV18-450BZXC 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:BGA包装说明:13 X 15 MM, 1.40 MM HEIGHT, LEAD FREE, MO-216, FBGA-165
针数:165Reach Compliance Code:unknown
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.75Is Samacsys:N
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):450 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:15 mm内存密度:18874368 bit
内存集成电路类型:DDR SRAM内存宽度:18
湿度敏感等级:3功能数量:1
端子数量:165字数:1048576 words
字数代码:1000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:1MX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.34 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.65 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:20宽度:13 mm
Base Number Matches:1

CY7C11681KV18-450BZXC 数据手册

 浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第2页浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第3页浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第4页浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第5页浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第6页浏览型号CY7C11681KV18-450BZXC的Datasheet PDF文件第7页 
CY7C11661KV18, CY7C11771KV18  
CY7C11681KV18, CY7C11701KV18  
18-Mbit DDR II+ SRAM Two-Word Burst  
Architecture (2.5 Cycle Read Latency)  
18-Mbit DDR II+ SRAM Two-Burst Architecture (2.5 Cycle Read Latency)  
Features  
Functional Description  
18-Mbit density (2 M × 8, 2 M × 9, 1 M × 18, 512 K × 36)  
550 MHz clock for high bandwidth  
The CY7C11661KV18, CY7C11771KV18, CY7C11681KV18,  
and CY7C11701KV18 are 1.8 V Synchronous Pipelined SRAMs  
equipped with DDR II+ architecture. The DDR II+ consists of an  
SRAM core with advanced synchronous peripheral circuitry.  
Addresses for read and write are latched on alternate rising  
edges of the input (K) clock. Write data is registered on the rising  
edges of both K and K. Read data is driven on the rising edges  
of K and K. Each address location is associated with two 8-bit  
words (CY7C11661KV18), 9-bit words (CY7C11771KV18),  
2-word burst for reducing address bus frequency  
Double data rate (DDR) interfaces  
(data transferred at 1100 MHz) at 550 MHz  
Available in 2.5 clock cycle latency  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
18-bit  
words  
(CY7C11681KV18),  
or  
36-bit  
words  
(CY7C11701KV18) that burst sequentially into or out of the  
device.  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Asynchronous inputs include an output impedance matching  
input (ZQ). Synchronous data outputs (Q, sharing the same  
physical pins as the data inputs D) are tightly matched to the two  
output echo clocks CQ/CQ, eliminating the need for separately  
capturing data from each individual DDR SRAM in the system  
design.  
Data valid pin (QVLD) to indicate valid data on the output  
Synchronous internally self-timed writes  
DDR II+ operates with 2.5 cycle read latency when DOFF is  
asserted HIGH  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
OperatessimilartoDDRIdevicewith1cyclereadlatencywhen  
DOFF is asserted LOW  
[1]  
Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4 V to VDD  
Supports both 1.5 V and 1.8 V I/O supply  
Table 1. Selection Guide  
550 500 450 400  
Description  
Unit  
HSTL inputs and variable drive HSTL output buffers  
Available in 165-Ball FBGA package (13 × 15 × 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
JTAG 1149.1 compatible test access port  
MHz MHz MHz MHz  
Maximum operating  
frequency  
550 500 450 400 MHz  
Maximum operating  
current  
x8 740 690 630 580 mA  
x9 740 690 630 580  
x18 760 700 650 590  
x36 970 890 820 750  
Phase-locked loop (PLL) for accurate data placement  
Configurations  
With Read cycle latency of 2.5 cycles:  
CY7C11661KV18 – 2 M × 8  
CY7C11771KV18 – 2 M × 9  
CY7C11681KV18 – 1 M × 18  
CY7C11701KV18 – 512 K × 36  
Note  
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V  
= 1.4 V to V  
.
DD  
DDQ  
Cypress Semiconductor Corporation  
Document Number: 001-53199 Rev. *I  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 31, 2011  
[+] Feedback  

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