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CY62147G30-45BVXAT PDF预览

CY62147G30-45BVXAT

更新时间: 2024-11-06 14:56:39
品牌 Logo 应用领域
英飞凌 - INFINEON 静态存储器
页数 文件大小 规格书
20页 585K
描述
Asynchronous SRAM

CY62147G30-45BVXAT 数据手册

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CY62147G/CY621472G  
MoBL® Automotive  
4-Mbit (256K words × 16-bit) Static RAM  
with Error-Correcting Code (ECC)  
4-Mbit (256K words  
× 16-bit) Static RAM with Error-Correcting Code (ECC)  
Data writes are performed by asserting the Write Enable (WE)  
input LOW, while providing the data on I/O0 through I/O15 and  
address on A0 through A17 pins. The Byte High Enable (BHE)  
and Byte Low Enable (BLE) inputs control write operations to the  
upper and lower bytes of the specified memory location. BHE  
controls I/O8 through I/O15 and BLE controls I/O0 through I/O7.  
Features  
High speed: 45 ns/55 ns  
Temperature Ranges  
Automotive-A: -40 C to +85 C  
Automotive-E: -40 C to +125 C  
Ultra-low standby power  
Typical standby current: 3.5 A  
Embedded ECC for single-bit error correction[1, 2]  
Data reads are performed by asserting the Output Enable (OE)  
input and providing the required address on the address lines.  
Read data is accessible on the I/O lines (I/O0 through I/O15).  
Byte accesses can be performed by asserting the required byte  
enable signal (BHE or BLE) to read either the upper byte or the  
lower byte of data from the specified address location.  
Wide voltage range: 2.2 V to 3.6 V  
1.0-V data retention  
TTL-compatible inputs and outputs  
Pb-free 48-ball VFBGA and 44-pin TSOP II packages  
All I/Os (I/O0 through I/O15) are placed in a HI-Z state when the  
device is deselected (CE HIGH for a single chip enable device  
and CE1 HIGH/CE2 LOW for a dual chip enable device), or  
control signals are deasserted (OE, BLE, BHE).  
Functional Description  
The device also has a unique Byte Power down feature, where,  
if both the Byte Enables (BHE and BLE) are disabled, the  
devices seamlessly switch to standby mode irrespective of the  
state of the chip enables, thereby saving power.  
CY62147G/CY621472G is high-performance CMOS low-power  
(MoBL) SRAM devices with embedded ECC. Both devices are  
offered in single and dual chip enable options and in multiple pin  
configurations.  
Devices with a single chip enable input are accessed by  
asserting the chip enable (CE) input LOW. Dual chip enable  
devices are accessed by asserting both chip enable inputs – CE1  
as low and CE2 as HIGH.  
The logic block diagrams are on page 2.  
Notes  
1. This device does not support automatic write-back on error detection.  
2. SER FIT Rate <0.1 FIT/Mb. Refer AN88889 for details.  
Cypress Semiconductor Corporation  
Document Number: 001-95424 Rev. *E  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised April 2, 2018  

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