CY54FCT573T, CY74FCT573T
8-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS068 – OCTOBER 2001
CY54FCT573T . . . D PACKAGE
CY74FCT573T . . . P, Q, OR SO PACKAGE
(TOP VIEW)
Function and Pinout Compatible With FCT
and F Logic
Reduced V
of Equivalent FCT Functions
(Typically = 3.3 V) Versions
OH
OE
1
2
3
4
5
6
7
8
9
20
19
18
17
16
15
14
13
12
V
CC
D
O
O
O
O
O
O
O
O
Edge-Rate Control Circuitry for
Significantly Improved Noise
Characteristics
0
0
1
2
3
4
5
6
7
D
1
D
D
D
D
D
D
2
3
4
5
6
7
I
Supports Partial-Power-Down Mode
off
Operation
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
GND 10
11 LE
– 1000-V Charged-Device Model (C101)
Matched Rise and Fall Times
Fully Compatible With TTL Input and
Output Logic Levels
3-State Outputs
CY54FCT573T
– 32-mA Output Sink Current
– 12-mA Output Source Current
CY74FCT573T
– 64-mA Output Sink Current
– 32-mA Output Source Current
description
The ’FCT573T devices consist of eight latches with 3-state outputs for bus-organized applications. When the
latch-enable (LE) input is high, the flip-flops appear transparent to the data. Data that meets the required setup
times are latched when LE transitions from high to low. Data appears on the bus when the output-enable (OE)
input is low. When OE is high, the bus output is in the high-impedance state. In this mode, data can be entered
into the latches. The ’FCT573T devices are identical to the ’FCT373T devices, except for the flow-through
pinout of the ’FCT573T, which simplifies board design.
These devices are fully specified for partial-power-down applications using I . The I circuitry disables the
off
off
outputs, preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2001, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
unless otherwise noted. On all other products, production
testing of all parameters.
processing does not necessarily include testing of all parameters.
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