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CXK79M72C161GB-44 PDF预览

CXK79M72C161GB-44

更新时间: 2024-11-30 17:00:47
品牌 Logo 应用领域
索尼 - SONY 时钟静态存储器内存集成电路
页数 文件大小 规格书
27页 361K
描述
Standard SRAM, 256KX72, 2.3ns, CMOS, PBGA209, 14 X 22 MM, 1 MM PITCH, PLASTIC, BGA-209

CXK79M72C161GB-44 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:BGA, BGA209,11X19,40针数:209
Reach Compliance Code:unknownECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.92
最长访问时间:2.3 ns最大时钟频率 (fCLK):227 MHz
I/O 类型:COMMONJESD-30 代码:R-PBGA-B209
JESD-609代码:e0长度:22 mm
内存密度:18874368 bit内存集成电路类型:STANDARD SRAM
内存宽度:72功能数量:1
端子数量:209字数:262144 words
字数代码:256000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:
组织:256KX72输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装等效代码:BGA209,11X19,40封装形状:RECTANGULAR
封装形式:GRID ARRAY并行/串行:PARALLEL
峰值回流温度(摄氏度):240电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:2.3 mm
最大待机电流:0.25 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.7 mA
最大供电电压 (Vsup):1.95 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:OTHER
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:10宽度:14 mm
Base Number Matches:1

CXK79M72C161GB-44 数据手册

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CXK79M72C161GB CXK79M18C161GB  
CXK79M36C161GB  
SONYÒ SRAM  
33/4/44  
16Mb 1x1Lp LVCMOS High Speed Synchronous SRAMs (256Kb x 72 or 512Kb x 36 or 1Mb x 18)  
Preliminary  
Description  
The CXK79M72C161GB (organized as 262,144 words by 72 bits), CXK79M36C161GB (organized as 524,288 words by 36  
bits), and the CXK79M18C161GB (organized as 1,048,576 words by 18 bits) are high speed CMOS synchronous static RAMs  
with common I/O pins. They are manufactured in compliance with the JEDEC-standard 209 pin BGA package pinouts defined  
for SigmaRAMs. They integrate input registers, high speed RAM, output registers, and a two-deep write buffer onto a single  
monolithic IC. Single Data Rate (SDR) Pipelined (PL) read operations and Late Write (LW) write operations are supported,  
providing a high-performance user interface. Positive and negative output clocks are provided for applications requiring source-  
synchronous operation.  
All address and control input signals are registered on the rising edge of the CK input clock.  
During read operations, output data is driven valid once, from the rising edge of CK, one full cycle after the address and control  
signals are registered.  
During write operations, input data is registered once, on the rising edge of CK, one full cycle after the address and control  
signals are registered.  
Output drivers are series-terminated, and output impedance is selectable via the ZQ control pin. When ZQ is tied “low”, the  
impedance of the SRAM’s output drivers is set to ~25W. When ZQ is tied “high” or left unconnected, the impedance of the  
SRAM’s output drivers is set to ~50W.  
300 MHz operation (300 Mbps) is obtained from a single 1.8V power supply. JTAG boundary scan interface is provided using  
a subset of IEEE standard 1149.1 protocol.  
Features  
3 Speed Bins  
Cycle Time / Data Access Time  
3.3ns / 1.8ns  
-33  
-4  
4.0ns / 2.1ns  
-44  
4.4ns / 2.3ns  
Single 1.8V power supply (V ): 1.7V (min) to 1.95V (max)  
DD  
Dedicated output supply voltage (V  
LVCMOS-compatible I/O interface  
Common I/O  
): 1.8V or 1.5V typical  
DDQ  
Single Data Rate (SDR) data transfers  
Pipelined (PL) read operations  
Late Write (LW) write operations  
Burst capability with internally controlled Linear Burst address sequencing  
Burst length of two, three, or four, with automatic address wrap  
Full read/write data coherency  
Byte write capability  
Two cycle deselect  
Single-ended input clock (CK)  
Data-referenced output clocks (CQ/CQ)  
Selectable output driver impedance via dedicated control pin (ZQ)  
Depth expansion capability (2 or 4 banks) via programmable chip enables (E2, E3, EP2, EP3)  
JTAG boundary scan (subset of IEEE standard 1149.1)  
209 pin (11x19), 1mm pitch, 14mm x 22mm Ball Grid Array (BGA) package  
16Mb 1x1Lp, LVCMOS, rev 0.2  
1 / 27  
July 6, 2001  

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