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CXK79M36C164GB-5 PDF预览

CXK79M36C164GB-5

更新时间: 2024-11-29 14:49:15
品牌 Logo 应用领域
索尼 - SONY 时钟静态存储器内存集成电路
页数 文件大小 规格书
28页 496K
描述
Standard SRAM, 512KX36, 2.3ns, CMOS, PBGA209, 14 X 22 MM, 1 MM PITCH, PLASTIC, BGA-209

CXK79M36C164GB-5 技术参数

生命周期:Obsolete零件包装代码:BGA
包装说明:BGA, BGA209,11X19,40针数:209
Reach Compliance Code:unknownECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:2.3 ns其他特性:PIPELINED ARCHITECTURE; LATE WRITE
最大时钟频率 (fCLK):200 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B209长度:22 mm
内存密度:18874368 bit内存集成电路类型:STANDARD SRAM
内存宽度:36功能数量:1
端子数量:209字数:524288 words
字数代码:512000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:
组织:512KX36输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装等效代码:BGA209,11X19,40封装形状:RECTANGULAR
封装形式:GRID ARRAY并行/串行:PARALLEL
电源:1.5/1.8,1.8 V认证状态:Not Qualified
座面最大高度:2.3 mm最大待机电流:0.25 A
最小待机电流:1.7 V子类别:SRAMs
最大压摆率:0.47 mA最大供电电压 (Vsup):1.95 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:OTHER端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
宽度:14 mmBase Number Matches:1

CXK79M36C164GB-5 数据手册

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SONY ΣRAMCXK79M72C164GB / CXK79M36C164GB 33/4/5  
18Mb 1x1Dp HSTL High Speed Synchronous SRAMs (256Kb x 72 or 512Kb x 36)  
Preliminary  
Description  
The CXK79M72C164GB (organized as 262,144 words by 72 bits) and the CXK79M36C164GB (organized as 524,288 words  
by 36 bits) are high speed CMOS synchronous static RAMs with common I/O pins. They are manufactured in compliance with  
the JEDEC-standard 209 pin BGA package pinouts defined for SigmaRAMdevices. They integrate input registers, high speed  
RAM, output registers, and a two-deep write buffer onto a single monolithic IC. Single Data Rate (SDR) Pipelined (PL) read  
operations and Double Late Write (DLW) write operations are supported, providing a high-performance user interface. Positive  
and negative output clocks are provided for applications requiring source-synchronous operation.  
All address and control input signals are registered on the rising edge of the CK differential input clock.  
During read operations, output data is driven valid once, from the rising edge of CK, one full cycle after the address and control  
signals are registered.  
During write operations, input data is registered once, on the rising edge of CK, two full cycles after the address and control  
signals are registered.  
Output drivers are series-terminated, and output impedance is programmable via the ZQ control pin. When an external resistor  
RQ is connected between ZQ and VSS, the impedance of the SRAM’s output drivers is set to ~RQ/5.  
300 MHz operation (300 Mbps) is obtained from a single 1.8V power supply. JTAG boundary scan interface is provided using  
a subset of IEEE standard 1149.1 protocol.  
Features  
3 Speed Bins  
Cycle Time / Data Access Time  
3.3ns / 1.8ns  
-33  
-4  
4.0ns / 2.1ns  
-5  
5.0ns / 2.3ns  
• Single 1.8V power supply (VDD): 1.7V (min) to 1.95V (max)  
• Dedicated output supply voltage (VDDQ): 1.4V (min) to VDD (max)  
• HSTL-compatible I/O interface with dedicated input reference voltage (VREF): VDDQ/2 typical  
• Common I/O  
• Single Data Rate (SDR) data transfers  
• Pipelined (PL) read operations  
• Double Late Write (DLW) write operations  
• Burst capability with internally controlled Linear Burst address sequencing  
• Burst length of two, three, or four, with automatic address wrap  
• Full read/write data coherency  
• Byte write capability  
• Differential input clocks (CK and CK)  
• Data-referenced output clocks (CQ1, CQ1, CQ2, CQ2)  
• Programmable output driver impedance via dedicated control pin (ZQ)  
• Depth expansion capability (2 or 4 banks) via programmable chip enables (E2, E3, EP2, EP3)  
• JTAG boundary scan (subset of IEEE standard 1149.1)  
• 209 pin (11x19), 1mm pitch, 14mm x 22mm Ball Grid Array (BGA) package  
18Mb 1x1Dp, HSTL, rev 1.1  
1 / 28  
November 8, 2002  

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