COUNT
COUNT
REV
DESCRIPTION OF REVISIONS
BY
CHKD DATE
REV
DESCRIPTION OF REVISIONS
BY
CHKD DATE
REVISED
REVISED
REVISED
JS.PARK HJ.LEE 16.08.03
JS.PARK HJ.LEE 16.10.12
JS.PARK HJ.KIM 16.12.07
REVISED
REVISED
REVISED
HJ.KIM
HJ.LEE 16.12.07
-
-
-
2
6
-
2
5
SY.PARK HJ.LEE 17.11.28
YG.KIM HJ.LEE 21.08.31
3
6
4
7
Universal Serial Bus Type-C Cable and Connector Specification Release 2.1
APPLICABLE STANDARD
Universal Serial Bus Type-C Connectors and Cable Assemblies Compliance Document Revision 2.1b
1.25A max. for each power pin (i.e. A1, A4, A9, A12, B1, B4, B5, B9, B12)
0.25A for the other pins
CURRENT
VOLTAGE
RATING
20V AC/DC
OPERATING CONDITION
STORAGE CONDITION
-40℃ ~ +105℃(INCLUDING TEMP. RISE), 95% RH MAX.(NON-CONDENSING)
-10℃ ~ +60℃(WITH PACKING), 15% ~ 70% RH
Para.
1
Test Description
Test Procedure
Test Requirement
No physical damage
QT AT
O O
EIA 364-18
Examination of product
Visual inspection
Electrical Requirements
EIA 364-23
Measure at 20mV max open circuit at
100mA(DC OR 1000Hz).
Low Level Contact
40mΩ max initial for each contact.
50mΩ max after initial measurement.
2
O -
Resistance
4-wire measurement is required and the
resistance of PCB termination shall be
deducted from the reading.
EIA 364-20
Dielectric
Measure per Method B with unmated
condition.
3
No distruptive discharge.
100MΩ Min.
O -
Withstanding Voltage
100VAC RMS for 1 minute at sea level.
EIA 364-21
4
Insulation Resistance
O -
500VDC with unmated and mated condition.
Mechanical Requirements
Initial : 5N to 20N
After test : 5N to 20N
(with virgin socket)
EIA 364-13
5
6
Insertion force
Extraction force
O -
O -
Measure at 12.5mm/minute min.
Initial : 8N to 20N
After test : 6N to 20N
(with virgin socket)
EIA 364-13
Measure at 12.5mm/minute min.
Low level contact resistance and
dielectric withstanding voltage shall
meet the spec after test.
EIA 364-09
7
Durability
Vibration
10,000 insertion/extration cycles
Cycle rate : 500±50 cycles per hour.
O -
EIA 364-28
No physical damage and no
discontinuity longer than 1us.
Low level contact resistance shall
Test Condition VII, Test Letter D
20-500 Hz random levels, 15minutes in
8
O -
each of 3 mutually perpendicular directions. meet spec before and after the test.
REMARKS
DRAFT
DESIGN
CHECK
APPROVAL
RELEASE
DEPT
21.08.31
ENG
JS.PARK
16.08.03
JS.PARK
16.08.03
HJ.LEE
TS.KANG
16.08.03
16.08.03
NOTE) QT : QUALIFICATION TEST, AT : ASSURANCE TEST, O: Applicable Test
DWG NO CL NO
PART NO
CX60-24S-UNIT
ELC4-631979-00
CL 6240-0001-9
1
HIROSE KOREA.CO.,LTD
PRODUCT SPECIFICATION
3