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CPC5602C PDF预览

CPC5602C

更新时间: 2024-09-15 22:40:15
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4页 79K
描述
N Channel Depletion Mode FET

CPC5602C 数据手册

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CPC5602C  
N Channel Depletion Mode FET  
Description  
Features  
The CPC5602C is an “N” channel depletion mode Field  
Effect Transistor (FET) that utilizes Clare’s proprietary  
third generation vertical DMOS process. The third  
generation process realizes world class, high voltage  
MOSFET performance in an economical silicon gate  
process. The vertical DMOS process yields a highly  
reliable device particularly in difficult application  
environments such as telecommunications.  
Low on resistance 10 ohms  
High input impedance  
Low input and output leakage  
Small package size SOT-223  
PC Card (PCMCIA) Compatible  
PCB Space and Cost Savings  
Applications  
Support Component for LITELINK TM  
Data Access Arrangement (DAA)  
Normally-on switch  
One of the primary applications for the CPC5602C is as  
a linear regulator/ hook switch for the LITELINKTM Data  
Access Arrangements (DAA) Devices (CPC5610A,  
CPC5611A, CPC5604A).  
Telecom  
Constant Current Source  
The CPC5602C has a typical on-resistance of 8, a  
breakdown voltage exceeding 350V and is available in  
an SOT-223 package. As with all MOS devices, the FET  
structure prevents thermal runaway and thermal-induced  
secondary breakdown.  
Ordering Information  
Absolute Maximum Ratings  
Part #  
CPC5602C  
Description  
N-Channel Depletion Mode FET,  
SOT-223 Package  
Parameter  
DSS Voltage  
Min  
Max  
350  
Units  
V
V
Total Package Dissipation  
Operational Temperature  
Storage Temperature  
2.5  
W
OC  
OC  
OC  
CPC5602CTR N-Channel Depletion Mode, SOT-  
223 Package  
-40  
-40  
+85  
+125  
+220  
FET-TAPE and Reel (1000 units min)  
Soldering Temperature  
Absolute Maximum Ratings are stress ratings. Stresses in  
excess of these ratings can cause permanent damage to  
the device. Functional operation of the device at these or  
any other conditions beyond those indicated in the opera-  
tional sections of this data sheet is not implied. Exposure  
of the device to the absolute maximum ratings for an ex-  
tended period may degrade the device and effect its reli-  
ability.  
DS-CPC5602C-Rev. 1  
1
www.clare.com  

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