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CMF05 PDF预览

CMF05

更新时间: 2024-09-23 12:54:31
品牌 Logo 应用领域
东芝 - TOSHIBA 整流二极管测试光电二极管快速恢复二极管
页数 文件大小 规格书
6页 188K
描述
High-Speed Rectifier Applications (Fast Recovery)

CMF05 技术参数

生命周期:Active包装说明:R-PDSO-F2
针数:2Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.10.00.70
风险等级:5.71Is Samacsys:N
应用:FAST RECOVERY配置:SINGLE
二极管元件材料:SILICON二极管类型:RECTIFIER DIODE
最大正向电压 (VF):2.7 VJESD-30 代码:R-PDSO-F2
最大非重复峰值正向电流:10 A元件数量:1
相数:1端子数量:2
最高工作温度:125 °C最低工作温度:-40 °C
最大输出电流:0.5 A封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
认证状态:Not Qualified最大重复峰值反向电压:1000 V
最大反向电流:50 µA最大反向恢复时间:0.1 µs
反向测试电压:800 V表面贴装:YES
端子形式:FLAT端子位置:DUAL
Base Number Matches:1

CMF05 数据手册

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CMF05  
TOSHIBA Fast Recovery Diode Silicon Diffused Type  
CMF05  
Unit: mm  
High-Speed Rectifier Applications (Fast Recovery)  
Switching Mode Power Supply Applications  
DC-DC Converter Applications  
Repetitive peak reverse voltage: V  
= 1000 V  
RRM  
Average forward current: I  
= 0.5 A  
F (AV)  
Forward voltage: V  
= 2.7 V (max)  
FM  
Very fast reverse-recovery time: t = 100 ns (max)  
rr  
Suitable for compact assembly due to the use of a small  
0.16  
TM  
1.75 ± 0.1  
surface-mount package“ MFLAT ” (Toshiba package name)  
+ 0.2  
2.4 0.1  
Absolute Maximum Ratings (Ta = 25°C)  
ANODE  
CATHODE  
Characteristic  
Symbol  
Rating  
Unit  
Repetitive peak reverse voltage  
Average forward current  
V
1000  
V
A
RRM  
I
0.5 (Note 1)  
F (AV)  
JEDEC  
Peak one-cycle surge forward current  
(non-repetitive)  
10 (50 Hz)  
(Note 2)  
I
A
FSM  
JEITA  
TOSHIBA  
3-4E1A  
Junction temperature  
T
40 to 125  
40 to 150  
°C  
°C  
j
Storage temperature range  
T
stg  
Weight: 0.023 g (typ.)  
Note 1: T= 92°C  
Rectangular waveform (α = 180°)  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/ “Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-02-17  

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