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CD4025BMJ/883 PDF预览

CD4025BMJ/883

更新时间: 2024-09-15 15:29:19
品牌 Logo 应用领域
德州仪器 - TI 输入元件逻辑集成电路触发器
页数 文件大小 规格书
7页 17K
描述
4000/14000/40000 SERIES, TRIPLE 3-INPUT NOR GATE, CDIP14, DIP-14

CD4025BMJ/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP14,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.62
系列:4000/14000/40000JESD-30 代码:R-GDIP-T14
JESD-609代码:e0长度:19.43 mm
逻辑集成电路类型:NOR GATE功能数量:3
输入次数:3端子数量:14
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DIP
封装等效代码:DIP14,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT SPECIFIED
电源:5/15 V传播延迟(tpd):350 ns
认证状态:Not Qualified施密特触发器:NO
筛选级别:MIL-STD-883座面最大高度:5.08 mm
子类别:Gates最大供电电压 (Vsup):15 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:7.62 mmBase Number Matches:1

CD4025BMJ/883 数据手册

 浏览型号CD4025BMJ/883的Datasheet PDF文件第2页浏览型号CD4025BMJ/883的Datasheet PDF文件第3页浏览型号CD4025BMJ/883的Datasheet PDF文件第4页浏览型号CD4025BMJ/883的Datasheet PDF文件第5页浏览型号CD4025BMJ/883的Datasheet PDF文件第6页浏览型号CD4025BMJ/883的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/10/95  
Last Update Date: 05/14/98  
MNCD4025BM-X REV 1A0  
Last Major Revision Date: 03/04/98  
BUFFERED TRIPLE 3-INPUT NOR GATE  
General Description  
These triple gates are monolithic complementary MOS (CMOS) integrated circuits constructed  
with N- and P-channel enhancement mode transistors. They have equal source and sink  
current capabilities and conform to standard B series output drive. The devices also have  
buffered outputs which improve transfer characteristics by providing very high gain. All  
inputs are protected against static discharge with diodes to Vdd and Vss.  
Industry Part Number  
NS Part Numbers  
CD4025BM  
CD4025BMJ/883  
CD4025BMW/883  
Prime Die  
CD4025BM  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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