High-Speed InGaAs PIN
Photodiodes
Description
EVERYTHING
IN A
High-speed InGaAs photodiodes from
PerkinElmer Optoelectronics are
designed for use in OEM fiber optic
communications systems and high-
speed receiver applications including
trunk line, LAN, fiber-in-the-loop and
data communications. Ceramic
submount packages are available for
easy integration into high-speed
SONET, FDDI, or datalink receiver
modules, or as back-facet power
monitors in laser diode modules.
C30616, C30637, C30617, C30618
NEW
LIGHT.
Photodiodes are available in hermetic
TO-18 packages, or in connectorized
receptacle packages with industry
standard ST, FC or SC connectors.
These are designed for mating to either
single or multimode fibers. Photodiodes
are also available in a fibered package
with either single or multimode fiber
pigtail, which can be terminated with
either an ST, FC or SC connector.
Receptacled and fibered packages use
a ball-lens TO-18 package to maximize
coupling efficiency. All devices are
planar passivated and feature proven
high reliability mounting and contacting.
An MTTF of >109 hours (approximate-
ly 105 years) at 50oC has been
demonstrated with an extended high temperature burn-
in at 200oC for 168 hours (VR = 10V), ensuring an
MTTF > 107 hours at 50oC (E = 0.7eV). Finally, all
A
production devices are screened with a 16 hour, 200oC
burn-in (VR = 10V) and tested to meet responsivity,
spectral noise and dark current specifications.
Features
demonstrated to date from standard
production samples.
• 50, 75, 100, 350 µm diameters
• High responsivity at 1300 and 1550nm
• Low capacitance for high bandwidths (to 3.5GHz)
• Available in various package options
Quality and Reliability
PerkinElmer Optoelectronics is
committed to supplying the highest
quality product to our customers, and
we are certified to meet ISO-9001 and
operate to MIL-Q-9858A and AQAP-1
quality standards. Process control is
maintained through annual re-
Applications
• High-speed communications
• SONET/ATM, FDDI
• Datalinks & LANs
qualification of production units and
includes extensive electrical, thermal
and mechanical stress as well as an
extended lifetest. In addition, every
wafer lot is individually qualified to meet
responsivity, capacitance and dark
current specifications, and reliability is
• Fiber optic sensors